Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Results
Lorenz, J. K., Bar, E., Clees, T., Evanschitzky, P., Jancke, R., Kampen, C., Paschen, U., Salzig, C. P. J., Selberherr, S.
Published in IEEE transactions on electron devices (01.08.2011)
Published in IEEE transactions on electron devices (01.08.2011)
Get full text
Journal Article
Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Methodology : CHARACTERIZATION OF NANO CMOS VARIABIALITY BY SIMULATION AND MEASUREMENTS
LORENZ, Jürgen K, BAR, Eberhard, CLEES, Tanja, JANCKE, Roland, SALZIG, Christian P. J, SELBERHERR, Siegfried
Published in IEEE transactions on electron devices (2011)
Get full text
Published in IEEE transactions on electron devices (2011)
Journal Article
Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Results : CHARACTERIZATION OF NANO CMOS VARIABIALITY BY SIMULATION AND MEASUREMENTS
LORENZ, Jürgen K, BÄR, Eberhard, CLEES, Tanja, EVANSCHITZKY, Peter, JANCKE, Roland, KAMPEN, Christian, PASCHEN, Uwe, SALZIG, Christian P. J, SELBERHERR, Siegfried
Published in IEEE transactions on electron devices (2011)
Get full text
Published in IEEE transactions on electron devices (2011)
Journal Article