Impact of circuit metallization on dielectric permittivity measurement by scanning microwave microscopy
Sakamaki, Ryo, Hirano, Iku, Horibe, Masahiro
Published in Japanese Journal of Applied Physics (01.11.2020)
Published in Japanese Journal of Applied Physics (01.11.2020)
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Journal Article
Demonstration of in-situ dielectric permittivity measurement using precision probing technique
Sakamaki, Ryo, Horibe, Masahiro, Tsurumi, Takaaki
Published in Japanese Journal of Applied Physics (01.11.2018)
Published in Japanese Journal of Applied Physics (01.11.2018)
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Journal Article
Development of verification process for on-wafer measurement at millimeter-wave frequency
Sakamaki, Ryo, Horibe, Masahiro
Published in 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) (01.07.2016)
Published in 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) (01.07.2016)
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Conference Proceeding
Local DC electrical properties of La2/3−xLi3xTiO3 grain boundaries
SAKAMAKI, Ryo, SAKAMOTO, Norihiko, FUJIKI, Hiroyuki, KANEKO, Nobu-hisa
Published in Journal of the Ceramic Society of Japan (01.01.2016)
Published in Journal of the Ceramic Society of Japan (01.01.2016)
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Journal Article
Precision Adjustment of Probe-Tilt Angle With RF Signal Detection Technique
Sakamaki, Ryo, Horibe, Masahiro
Published in IEEE transactions on instrumentation and measurement (01.10.2020)
Published in IEEE transactions on instrumentation and measurement (01.10.2020)
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Journal Article
Long-term stability test on on-wafer measurement system in NMIJ
Sakamaki, Ryo, Horibe, Masahiro
Published in 2020 Conference on Precision Electromagnetic Measurements (CPEM) (01.08.2020)
Published in 2020 Conference on Precision Electromagnetic Measurements (CPEM) (01.08.2020)
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Conference Proceeding