In Situ X-Ray Measurement of Order-Disorder Transition Temperature of Fe-Rich Fe-Pt Alloys
Osaka, Keiichi, Sakaki, Daisuke, Takama, Toshihiko
Published in Japanese Journal of Applied Physics (01.02.2002)
Published in Japanese Journal of Applied Physics (01.02.2002)
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Journal Article
DEVICE FOR PRODUCING SILICON AND METHOD FOR PRODUCING SILICON
KONDOU, MASASHI, NAKAHARA, KATSUMASA, TAKEUCHI, YOSHINORI, SAKAKI, DAISUKE
Year of Publication 28.06.2012
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Year of Publication 28.06.2012
Patent
HIGH-TEMPERATURE VALVE DEVICE
KONDOU, MASASHI, NAKAHARA, KATSUMASA, TAKEUCHI, YOSHINORI, SAKAKI, DAISUKE
Year of Publication 28.06.2012
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Year of Publication 28.06.2012
Patent
ELECTROLYSIS SYSTEM
OHASHI, TADASHI, MATSUMURA, HISASHI, TAKEUCHI, YOSHINORI, SAKAKI, DAISUKE
Year of Publication 07.05.2009
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Year of Publication 07.05.2009
Patent
APPARATUS AND PROCESS FOR THE PRODUCTION OF SILICON
OHASHI, TADASHI, MATSUMURA, HISASHI, TAKEUCHI, YOSHINORI, SAKAKI, DAISUKE
Year of Publication 30.04.2009
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Year of Publication 30.04.2009
Patent
Experimental study on the correlation lengths of the statistical dynamical theory of X-ray diffraction by measurements of integrated intensities from silicon crystals with dislocations
Sakaki, Daisuke, Takama, Toshihiko
Published in Acta crystallographica. Section A, Foundations of crystallography (01.01.2002)
Published in Acta crystallographica. Section A, Foundations of crystallography (01.01.2002)
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