Comprehensive study of variability in poly-Si channel nanowire transistor
Ota, Kensuke, Kawai, Tomoya, Saitoh, Masumi
Published in Japanese Journal of Applied Physics (01.04.2019)
Published in Japanese Journal of Applied Physics (01.04.2019)
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Journal Article
Experimental Study of Random Telegraph Noise in Trigate Nanowire MOSFETs
Ota, Kensuke, Saitoh, Masumi, Tanaka, Chika, Matsushita, Daisuke, Numata, Toshinori
Published in IEEE transactions on electron devices (01.11.2015)
Published in IEEE transactions on electron devices (01.11.2015)
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Journal Article
Probing spatial heterogeneity in silicon thin films by Raman spectroscopy
Yamazaki, Hideyuki, Koike, Mitsuo, Saitoh, Masumi, Tomita, Mitsuhiro, Yokogawa, Ryo, Sawamoto, Naomi, Tomita, Motohiro, Kosemura, Daisuke, Ogura, Atsushi
Published in Scientific reports (29.11.2017)
Published in Scientific reports (29.11.2017)
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Journal Article
Toe Clearance Rehabilitative Slippers for Older Adults With Fall Risk: A Randomized Controlled Trial
Satoh, Atsuko, Kudoh, Yukoh, Lee, Sangun, Saitoh, Masumi, Miura, Miwa, Ohnuma, Yuka, Fukushi, Naoki, Sasaki, Hidetada
Published in Geriatric orthopaedic surgery & rehabilitation (2021)
Published in Geriatric orthopaedic surgery & rehabilitation (2021)
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Journal Article
Individual analysis of inter and intragrain defects in electrically characterized polycrystalline silicon nanowire TFTs by multicomponent dark-field imaging based on nanobeam electron diffraction two-dimensional mapping
Asano, Takanori, Takaishi, Riichiro, Oda, Minoru, Sakuma, Kiwamu, Saitoh, Masumi, Tanaka, Hiroki
Published in Japanese Journal of Applied Physics (01.04.2018)
Published in Japanese Journal of Applied Physics (01.04.2018)
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Journal Article
Channel size dependence of low-frequency noise in tri-gate silicon nanowire transistors
Saitoh, Masumi, Ota, Kensuke, Tanaka, Chika, Numata, Toshinori
Published in Japanese Journal of Applied Physics (01.04.2015)
Published in Japanese Journal of Applied Physics (01.04.2015)
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Journal Article
Experimental Study of Self-Heating Effects in Trigate Nanowire MOSFETs Considering Device Geometry
Ota, K., Saitoh, M., Tanaka, C., Nakabayashi, Y., Numata, T.
Published in IEEE transactions on electron devices (01.12.2012)
Published in IEEE transactions on electron devices (01.12.2012)
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Journal Article
Physical mechanism of source and drain resistance reduction for high-performance short-channel InGaZnO thin-film transistors
Ota, Kensuke, Sakuma, Kiwamu, Irisawa, Toshifumi, Tanaka, Chika, Matsushita, Daisuke, Saitoh, Masumi
Published in Japanese Journal of Applied Physics (01.04.2015)
Published in Japanese Journal of Applied Physics (01.04.2015)
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Journal Article
SPICE-Based Performance Analysis of Trigate Silicon Nanowire CMOS Circuits
Tanaka, C., Saitoh, M., Ota, K., Uchida, K., Numata, T.
Published in IEEE transactions on electron devices (01.04.2013)
Published in IEEE transactions on electron devices (01.04.2013)
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Journal Article
Physical Origins of Threshold Voltage Variation Enhancement in Si(110) n/pMOSFETs
Saitoh, Masumi, Yasutake, Nobuaki, Nakabayashi, Yukio, Uchida, Ken, Numata, Toshinori
Published in IEEE transactions on electron devices (01.10.2010)
Published in IEEE transactions on electron devices (01.10.2010)
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Journal Article
One-to-one correspondence between nm-resolution channel crystallinity and electrical property of poly-Si TFT revealed by NBD two-dimensional imaging
Asano, Takanori, Takaishi, Riichiro, Oda, Minora, Sakuma, Kiwamu, Saitoh, Masumi, Tanaka, Hiroki
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
Systematic study of RTN in nanowire transistor and enhanced RTN by hot carrier injection and negative bias temperature instability
Ota, Kensuke, Saitoh, Masumi, Tanaka, Chika, Matsushita, Daisuke, Numata, Toshinori
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
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Conference Proceeding
Enhanced Degradation by Negative Bias Temperature Stress in Si Nanowire Transistor
Ota, Kensuke, Saitoh, Masumi, Tanaka, Chika, Nakabayashi, Yukio, Uchida, Ken, Numata, Toshinori
Published in Japanese Journal of Applied Physics (01.02.2012)
Published in Japanese Journal of Applied Physics (01.02.2012)
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Journal Article
Nanowire-Width and Dopant-Species Dependences of Carrier Transport Characteristics of Schottky Barrier Source/Drain Nanowire Field-Effect Transistors
Ishikawa, Takayuki, Saitoh, Masumi, Ota, Kensuke, Tanaka, Chika, Numata, Toshinori
Published in Japanese Journal of Applied Physics (01.04.2012)
Published in Japanese Journal of Applied Physics (01.04.2012)
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Journal Article
Nanowire-Width and Dopant-Species Dependences of Carrier Transport Characteristics of Schottky Barrier Source/Drain Nanowire Field-Effect Transistors
Ishikawa, Takayuki, Saitoh, Masumi, Ota, Kensuke, Tanaka, Chika, Numata, Toshinori
Published in Japanese Journal of Applied Physics (01.04.2012)
Published in Japanese Journal of Applied Physics (01.04.2012)
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Journal Article