A compact model of I -V characteristic degradation for organic thin film transistors
Saito, Michiaki, Shintani, Michihiro, Kuribara, Kazunori, Ogasahara, Yasuhiro, Sato, Takashi
Published in 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) (01.03.2019)
Published in 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) (01.03.2019)
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Conference Proceeding
GAS-LIQUID CONTACTOR
SAITO MICHIAKI, OKUBO MASAHIKO, DAIGOBOU HIROMITSU, HANASHIMA HIROSHI, HANEBUCHI HIROOMI
Year of Publication 06.06.2019
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Year of Publication 06.06.2019
Patent
LENS SYSTEM AND CONTACT LENS
OKUMURA TAKESHI, KANEKO NORIO, SAITO MICHIAKI, MIZUTANI HIDEO, SUZUKI KAORI, SAKAKI MARIKO
Year of Publication 06.05.2016
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Year of Publication 06.05.2016
Patent
Measurement and Modeling of Frequency Degradation of an oTFT Ring Oscillator
Saito, Michiaki, Shintani, Michihiro, Kuribara, Kazunori, Ogasahara, Yasuhiro, Sato, Takashi
Published in 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2018)
Published in 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2018)
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Conference Proceeding
Gas liquid contacting device
SAITO MICHIAKI, HABUCHI HIROOMI, OKUBO MASAHIKO, HANASHIMA HIROSHI, DAIGOBO HIROMITSU
Year of Publication 14.05.2019
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Year of Publication 14.05.2019
Patent