Revisiting MOSFET threshold voltage extraction methods
Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Muci, Juan, Terán Barrios, Alberto, Liou, Juin J., Ho, Ching-Sung
Published in Microelectronics and reliability (01.01.2013)
Published in Microelectronics and reliability (01.01.2013)
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Journal Article
LprG and PE_PGRS33 Mycobacterium tuberculosis virulence factors induce differential mitochondrial dynamics in macrophages
Aguilar‐López, Bruno A., Correa, Francisco, Moreno‐ Altamirano, María Maximina B., Espitia, Clara, Hernández‐Longoria, Rocío, Oliva‐Ramírez, Jacqueline, Padierna‐Olivos, Juan, Sánchez‐García, Francisco J.
Published in Scandinavian journal of immunology (01.01.2019)
Published in Scandinavian journal of immunology (01.01.2019)
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Journal Article
A Review of Core Compact Models for Undoped Double-Gate SOI MOSFETs
Ortiz-Conde, Adelmo, Garcia-Sanchez, Francisco J., Muci, Juan, Malobabic, Slavica, Liou, Juin J.
Published in IEEE transactions on electron devices (01.01.2007)
Published in IEEE transactions on electron devices (01.01.2007)
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Journal Article
Metabolic Recovery with the Persistence of Proinflammatory Leucocyte Dysfunction After Bariatric Intervention for Obesity
Cérbulo-Vázquez, Arturo, Cabrera-Rivera, Libier, Mancilla-Herrera, Ismael, Castro-Eguiluz, Denisse, Sánchez-García, Francisco J., Ferat-Osorio, Eduardo A., Arriaga-Pizano, Lourdes A.
Published in Obesity surgery (01.05.2024)
Published in Obesity surgery (01.05.2024)
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Journal Article
Conductance-to-Current-Ratio-Based Parameter Extraction in MOS Leakage Current Models
Ortiz-Conde, Adelmo, Sucre-Gonzalez, Andrea, Torres-Torres, Reydezel, Molina, Joel, Murphy-Arteaga, Roberto S., Garcia-Sanchez, Francisco J.
Published in IEEE transactions on electron devices (01.10.2016)
Published in IEEE transactions on electron devices (01.10.2016)
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Journal Article
Threshold voltage extraction in Tunnel FETs
Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Muci, Juan, Sucre-González, Andrea, Martino, João Antonio, Agopian, Paula Ghedini Der, Claeys, Cor
Published in Solid-state electronics (01.03.2014)
Published in Solid-state electronics (01.03.2014)
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Journal Article
An Explicit Analytic Compact Model for Nanocrystalline Zinc Oxide Thin-Film Transistors
Garcia-Sanchez, F. J., Ortiz-Conde, A.
Published in IEEE transactions on electron devices (01.01.2012)
Published in IEEE transactions on electron devices (01.01.2012)
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Journal Article
An explicit multi-exponential model for semiconductor junctions with series and shunt resistances
Lugo-Muñoz, Denise, Muci, Juan, Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Souza, Michelly de, Pavanello, Marcelo A.
Published in Microelectronics and reliability (01.12.2011)
Published in Microelectronics and reliability (01.12.2011)
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Journal Article
Approximate analytical expression for the tersminal voltage in multi-exponential diode models
Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Terán Barrios, Alberto, Muci, Juan, de Souza, Michelly, Pavanello, Marcelo A.
Published in Solid-state electronics (01.11.2013)
Published in Solid-state electronics (01.11.2013)
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Journal Article
Integration-based approach to evaluate the sub-threshold slope of MOSFETs
Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Liou, Juin J., Ho, Ching-Sung
Published in Microelectronics and reliability (01.02.2010)
Published in Microelectronics and reliability (01.02.2010)
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Journal Article
Simplified EKV model parameter extraction in polysilicon MOSFETs
Ortiz-Conde, Adelmo, Ávila-Avendaño, Carlos, Quevedo-López, Manuel A., García-Sánchez, Francisco J.
Published in Solid-state electronics (01.09.2022)
Published in Solid-state electronics (01.09.2022)
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Journal Article
Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction
Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Muci, Juan, Lugo Muñoz, Denise C., Latorre Rey, Álvaro D., Ho, Ching-Sung, Liou, Juin J.
Published in Microelectronics and reliability (01.07.2009)
Published in Microelectronics and reliability (01.07.2009)
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