Search Results - "Ryu, Sung-gon" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Method for simultaneous review of hull girder strength and local strength of the midship section

Method for simultaneous review of hull girder strength and local strength of the midship section

by RYU SUNG GON
Year of Publication 14.05.2024

Get full text

Patent

FRP Calculation method for cross sectional properties of FRP vessel

FRP Calculation method for cross sectional properties of FRP vessel

by RYU SUNG GON
Year of Publication 02.03.2020

Get full text

Patent

OPTIMIZATION COUPLING STRUCTURE FOR FLARE TOWER AND PLANT STRUCTURE IN FLOATING OFFSHORE PLANT

OPTIMIZATION COUPLING STRUCTURE FOR FLARE TOWER AND PLANT STRUCTURE IN FLOATING OFFSHORE PLANT

by RYU, SUNG GON
Year of Publication 09.12.2014

Get full text

Patent

POLISHING APPARATUS AND POLISHING METHOD

POLISHING APPARATUS AND POLISHING METHOD

by RYU SUNG-GON, PARK JI-HOON, HAN JUNG-YEOL, KANG ZHIYONG
Year of Publication 08.07.2022

Get full text

Patent

POLISHING SYSTEM AND POLISHING METHOD

POLISHING SYSTEM AND POLISHING METHOD

by RYU SUNG-GON, PARK JI-HOON, LEE KI-HEON, HAN JUNG-YEOL
Year of Publication 01.04.2022

Get full text

Patent

Grinding system

Grinding system

by PARK YOUNG-HEE, RYU SUNG-GON, RYU JAE-YEON, LEE KI-HEON, HAN JUNG-YEOL
Year of Publication 21.06.2022

Get full text

Patent

METHOD FOR CALCULATING OF A DETECTING APPARATUS

METHOD FOR CALCULATING OF A DETECTING APPARATUS

by RYU, SUNG GON
Year of Publication 03.05.2006

Get full text

Patent

APPARATUS FOR DETECTING CHIPPING OF WAFER EDGE AND METHOD OF THE SAME

APPARATUS FOR DETECTING CHIPPING OF WAFER EDGE AND METHOD OF THE SAME

by RYU, SUNG GON
Year of Publication 26.12.2005

Get full text

Patent

METHOD OF INSPECTING A SURFACE OF A WATER

METHOD OF INSPECTING A SURFACE OF A WATER

by RYU, SUNG GON, CHO, HYUNG SUK, KIM, JOO WOO, HWANG, GEUK PIL
Year of Publication 16.01.2008

Get full text

Patent

Verfahren zur Defekterkennung in Mustern aus alternierend angeordneten Linien und Zwischenräumen auf einem Wafer

Verfahren zur Defekterkennung in Mustern aus alternierend angeordneten Linien und Zwischenräumen auf einem Wafer

by RYU, SUNG-GON, KIM, HYOUNG-JIN, CHOI, SANG-BONG, CHON, SANG-MUN, JUN, CHUNG-SAM, LEE, DONGUN
Year of Publication 08.01.2009

Get full text

Patent

METHOD FOR INSPECTING A DEFECT OF PATTERN IN SEMICONDUCTOR DEVICE

METHOD FOR INSPECTING A DEFECT OF PATTERN IN SEMICONDUCTOR DEVICE

by LIM, KYU HONG, RYU, SUNG GON, CHO, HYUNG SUK, KIM, SUNG KWEON
Year of Publication 01.02.2007

Get full text

Patent

METHOD OF DETECTING DEFECT OF A PATTERN IN A SEMICONDUCTOR DEVICE

METHOD OF DETECTING DEFECT OF A PATTERN IN A SEMICONDUCTOR DEVICE

by CHO HYUNG-SUK, RYU SUNG-GON, KIM SUNG-KWEON, LIM KYU-HONG
Year of Publication 01.02.2007

Get full text

Patent

Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same

Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same

by JUN CHUNG-SAM, RYU SUNG-GON, CHON SANG-MUN, KIM HYOUNG-JIN, CHOI SANG-BONG, LEE DONGUN
Year of Publication 11.04.2006

Get full text

Patent

Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same

Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same

by Jun, Chung-sam, Chon, Sang-mun, Kim, Hyoung-jin, Lee, Dong-chun, Choi, Sang-bong, Ryu, Sung-gon
Year of Publication 11.04.2006

Get full text

Patent

Characteristics of UV confocal microscopy inspection for detecting 0.1 /spl mu/m level defects

Characteristics of UV confocal microscopy inspection for detecting 0.1 /spl mu/m level defects

by Sang Mun Chon, Sang Bong Choi, Dong Chun Lee, Chung Sam Jun, Sung Gon Ryu, Sun Yong Choi
Published in 2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203) (2001)

Get full text

Conference Proceeding

LIGHTNESS CORRECTING METHOD, SELECTIVE DEFECT DETECTING METHOD AND RECORDING MEDIUM RECORDING THE METHODS

LIGHTNESS CORRECTING METHOD, SELECTIVE DEFECT DETECTING METHOD AND RECORDING MEDIUM RECORDING THE METHODS

by JUN CHUNG-SAM, RYU SUNG-GON, KIM HYOUNG-JIN, SAI SOHO, LEE DONGUN, CHON SANG-MOON
Year of Publication 21.02.2003

Get full text

Patent

Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same

Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same

by JUN CHUNG-SAM, RYU SUNG-GON, CHON SANG-MUN, KIM HYOUNG-JIN, CHOI SANG-BONG, LEE DONGUN
Year of Publication 21.11.2002

Get full text

Patent

Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same

Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same

by Chon, Sang-mun, Jun, Chung-sam, Kim, Hyoung-jin, Lee, Dong-chun, Choi, Sang-bong, Ryu, Sung-gon
Year of Publication 21.11.2002

Get full text

Patent

Verfahren zur Farbvariationskorrektur und Defekterkennung für Wafer

Verfahren zur Farbvariationskorrektur und Defekterkennung für Wafer

by RYU, SUNG-GON, KIM, HYOUNG-JIN, CHOI, SANG-BONG, CHON, SANG-MUN, JUN, CHUNG-SAM, LEE, DONGUN
Year of Publication 21.11.2002

Get full text

Patent