The Use of Spectral Ellipsometry and Raman Spectroscopy in Screening Diagnostics of Colorectal Cancer
Kruchinin, V. N., Kruchinina, M. V., Prudnikova, Ya. I., Spesivtsev, E. V., Rykhlitskii, S. V., Volodin, V. A., Shekhovtsov, S. V., Pel’tek, S. E.
Published in Optics and spectroscopy (01.07.2019)
Published in Optics and spectroscopy (01.07.2019)
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Journal Article
Atomic Structure and Optical Properties of Plasma Enhanced Chemical Vapor Deposited SiCOH Low-k Dielectric Film
Kruchinin, V. N., Volodin, V. A., Rykhlitskii, S. V., Gritsenko, V. A., Posvirin, I. P., Shi, Xiaoping, Baklanov, M. R.
Published in Optics and spectroscopy (01.06.2021)
Published in Optics and spectroscopy (01.06.2021)
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Journal Article
Electric and Viscoelastic Parameters of Erythrocytes in Models for Diagnostics of Adenomatous Polyps and Stages of Colorectal Cancer in Optical Detection of Cells in an Inhomogeneous Alternating Electric Field
Kruchinina, M. V., Gromov, A. A., Shcherbakova, L. V., Kruchinina, E. V., Generalov, V. M., Generalov, K. V., Kruchinin, V. N., Rykhlitskii, S. V., Yakovina, I. N., Yakovlev, M. V., Minin, O. V., Minin, I. V.
Published in Optics and spectroscopy (01.12.2021)
Published in Optics and spectroscopy (01.12.2021)
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Journal Article
Methodological and instrumental problems in high-precision in situ ellipsometry diagnostics of the mercury cadmium telluride layer composition in molecular beam epitaxy
Shvets, V. A., Azarov, I. A., Spesivtsev, E. V., Rykhlitskii, S. V., Yakushev, M. V., Marin, D. V., Mikhailov, N. N., Kuzmin, V. D., Remesnik, V. G., Dvoretsky, S. A.
Published in Instruments and experimental techniques (New York) (01.11.2016)
Published in Instruments and experimental techniques (New York) (01.11.2016)
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Journal Article
Measuring the normalized jones matrix of anisotropic samples by means of static ellipsometry
Shvets, V. A., Spesivtsev, E. V., Rykhlitskiĭ, S. V.
Published in Optics and spectroscopy (01.10.2008)
Published in Optics and spectroscopy (01.10.2008)
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Journal Article
Analysis of a static scheme of ellipsometric measurements
Shvets, V. A., Spesivtsev, E. V., Rykhlitskii, S. V.
Published in Optics and spectroscopy (01.09.2004)
Published in Optics and spectroscopy (01.09.2004)
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Journal Article
In situ spectroscopic ellipsometry for temperature control in molecular beam epitaxy of HgCdTe
Shvets, V.A., Marin, D.V., Azarov, I.A., Yakushev, M.V., Rykhlitskii, S.V.
Published in Journal of crystal growth (01.12.2022)
Published in Journal of crystal growth (01.12.2022)
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Journal Article
Ellipsometric thermometry in molecular beam epitaxy of mercury cadmium telluride
Marin, D.V., Shvets, V.A., Azarov, I.A., Yakushev, M.V., Rykhlitskii, S.V.
Published in Infrared physics & technology (01.08.2021)
Published in Infrared physics & technology (01.08.2021)
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Journal Article
Optical Properties of Nonstoichiometric Silicon Oxide SiOx (x < 2)
Kruchinin, V. N., Perevalov, T. V., Kamaev, G. N., Rykhlitskii, S. V., Gritsenko, V. A.
Published in Optics and spectroscopy (01.11.2019)
Published in Optics and spectroscopy (01.11.2019)
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Journal Article
Optical Properties of Nonstoichiometric Silicon Oxide SiO x (x < 2)
Kruchinin, V N, Perevalov, T V, Kamaev, G N, Rykhlitskii, S V, Gritsenko, V A
Published in Optics and spectroscopy (01.01.2019)
Published in Optics and spectroscopy (01.01.2019)
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Journal Article
Development of methods and instruments for optical ellipsometry at the Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences
Spesivtsev, E. V., Rykhlitskii, S. V., Shvets, V. A.
Published in Optoelectronics, instrumentation, and data processing (01.10.2011)
Published in Optoelectronics, instrumentation, and data processing (01.10.2011)
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Journal Article
Polarization Pyrometry of Layered Semiconductor Structures under Conditions of Low-Temperature Technological Processes
Azarov, I. A., Shvets, V. A., Dulin, S. A., Mikhailov, N. N., Dvoretskii, S. A., Ikusov, D. G., Uzhakov, I. N., Rykhlitskii, S. V.
Published in Optoelectronics, instrumentation, and data processing (01.11.2017)
Published in Optoelectronics, instrumentation, and data processing (01.11.2017)
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Journal Article
Ellipsometric in situ diagnostics of the growth of porous anodic oxide films on aluminum
Shvets, V. A., Kruchinin, V. N., Rykhlitskii, S. V., Prokop’ev, V. Yu, Uvarov, N. F.
Published in Optics and spectroscopy (01.02.2015)
Published in Optics and spectroscopy (01.02.2015)
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Journal Article