Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis
Wirtz, Tom, Fleming, Yves, Gysin, Urs, Glatzel, Thilo, Wegmann, Urs, Meyer, Ernst, Maier, Urs, Rychen, Jörg
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
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Journal Article
Conference Proceeding
Three dimensional imaging using secondary ion mass spectrometry and atomic force microscopy
Fleming, Yves, Wirtz, Tom, Gysin, Urs, Glatzel, Thilo, Wegmann, Urs, Meyer, Ernst, Maier, Urs, Rychen, Jörg
Published in Applied surface science (01.12.2011)
Published in Applied surface science (01.12.2011)
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Journal Article
Compensating electrostatic forces by single-scan Kelvin probe force microscopy
Ziegler, Dominik, Rychen, Jörg, Naujoks, Nicola, Stemmer, Andreas
Published in Nanotechnology (06.06.2007)
Published in Nanotechnology (06.06.2007)
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Journal Article