Key Factors for a Successful Telemedicine Solution for Cardiovascular Diseases: A Systematic Review
Russo, Giuseppe Felice, Basile, Ilaria, Ciampi, Mario, Silvestri, Stefano
Published in Applied sciences (01.09.2024)
Published in Applied sciences (01.09.2024)
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Journal Article
Dark Current Spectroscopy of Transition Metals in CMOS Image Sensors
Russo, Felice, Nardone, Giancarlo, Polignano, Maria Luisa, D'Ercole, Angelo, Pennella, Fabrizio, Felice, Massimo Di, Monte, Andrea Del, Matarazzo, Antonio, Moccia, Giuseppe, Polsinelli, Gianpaolo, D'Angelo, Antonio, Liverani, Massimo, Irrera, Fernanda
Published in ECS journal of solid state science and technology (01.01.2017)
Published in ECS journal of solid state science and technology (01.01.2017)
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Journal Article
Measuring teachers’ readiness to use ICT before the COVID-19 pandemic in Italy
D’Agostino, Antonella, Longobardi, Sergio, Migali, Giuseppe, Russo, Felice
Published in Quality & quantity (01.12.2023)
Published in Quality & quantity (01.12.2023)
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Journal Article
Intermunicipal cooperation in public procurement
Arachi, Giampaolo, Assisi, Debora, Cesi, Berardino, Giuranno, Michele G., Russo, Felice
Published in Regional studies (30.05.2024)
Published in Regional studies (30.05.2024)
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Journal Article
On Border Traps in Back-Side-Illuminated CMOS Image Sensor Oxides
Vici, Andrea, Russo, Felice, Lovisi, Nicola, Irrera, Fernanda
Published in IEEE transactions on electron devices (01.05.2020)
Published in IEEE transactions on electron devices (01.05.2020)
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Journal Article
The relevance of educational poverty in Europe: Determinants and remedies
Agasisti, Tommaso, Longobardi, Sergio, Prete, Vincenzo, Russo, Felice
Published in Journal of policy modeling (01.05.2021)
Published in Journal of policy modeling (01.05.2021)
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Journal Article
Forecast of CMOS Imagers Yield Learning by the Gompertz Model
Organtini, Paolo, Russo, Felice
Published in IEEE transactions on semiconductor manufacturing (01.08.2013)
Published in IEEE transactions on semiconductor manufacturing (01.08.2013)
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Journal Article
Generation of oxide traps in Back-Side-Illuminated CMOS Image Sensors and impact on reliability
Vici, Andrea, Russo, Felice, Lovisi, Nicola, Marchioni, Aldo, Casella, Antonio, Irrera, Fernanda
Published in ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) (01.09.2019)
Published in ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) (01.09.2019)
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Conference Proceeding