by Golyashov, V.A., Rusetsky, V.S., Shamirzaev, T.S., Dmitriev, D.V., Kislykh, N.V., Mironov, A.V., Aksenov, V.V., Tereshchenko, O.E.
Published in Ultramicroscopy (01.11.2020)

by Rusetsky, V S, Golyashov, V A, Eremeev, S V, Kustov, D A, Rusinov, I P, Shamirzaev, T S, Mironov, A V, A Yu Demin, Tereshchenko, O E
Published in arXiv.org (07.05.2022)

by Rusetsky, V. S., Golyashov, V. A., Mironov, A. V., Demin, A. Yu, Tereshchenko, O. E.
Published in Optoelectronics, instrumentation, and data processing (01.09.2021)

by Tereshchenko, O. E, Bakin, V. V, Stepanov, S. A, Golyashov, V. A, Mikaeva, A. S, Kustov, D. A, Rusetsky, V. S, Rozhkov, S. A, Scheibler, H. E, Demin, A. Yu
Year of Publication 20.09.2024

by Tereshchenko, O E, Bakin, V V, Stepanov, S A, Golyashov, V A, Mikaeva, A S, Kustov, D A, Rusetsky, V S, Rozhkov, S A, Scheibler, H E, A Yu Demin
Published in arXiv.org (20.09.2024)

by Mokrousov, A. V., Lisitsyna, L. I., Navrotsky, L. G., Rusetsky, V. S.
Published in 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) (01.10.2014)

by Navrotsky, L. G., Lisitsyna, L. I., Yudin, V. I., Belavskaya, S. V., Blokhin, A. A., Rusetsky, V. S.
Published in 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) (01.10.2014)