Demonstration of Conductive Bridging Random Access Memory (CBRAM) in logic CMOS process
Gopalan, C., Ma, Y., Gallo, T., Wang, J., Runnion, E., Saenz, J., Koushan, F., Blanchard, P., Hollmer, S.
Published in Solid-state electronics (01.04.2011)
Published in Solid-state electronics (01.04.2011)
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Thickness dependence of stress-induced leakage currents in silicon oxide
Runnion, E.F., Gladstone, S.M., Scott, R.S., Dumin, D.J., Lie, L., Mitros, J.C.
Published in IEEE transactions on electron devices (01.06.1997)
Published in IEEE transactions on electron devices (01.06.1997)
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Conductive-bridge memory (CBRAM) with excellent high-temperature retention
Jameson, J. R., Blanchard, P., Cheng, C., Dinh, J., Gallo, A., Gopalakrishnan, V., Gopalan, C., Guichet, B., Hsu, S., Kamalanathan, D., Kim, D., Koushan, F., Kwan, M., Law, K., Lewis, D., Ma, Y., McCaffrey, V., Park, S., Puthenthermadam, S., Runnion, E., Sanchez, J., Shields, J., Tsai, K., Tysdal, A., Wang, D., Williams, R., Kozicki, M. N., Wang, J., Gopinath, V., Hollmer, S., Van Buskirk, M.
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)
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Conference Proceeding
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Towards Automotive Grade Embedded RRAM
Jameson, J.R., Dinh, J., Gonzales, N., Hollmer, S., Hsu, S., Kim, D., Koushan, F., Lewis, D., Runnion, E., Shields, J., Tysdal, A., Wang, D., Gopinath, V.
Published in 2018 48th European Solid-State Device Research Conference (ESSDERC) (01.09.2018)
Published in 2018 48th European Solid-State Device Research Conference (ESSDERC) (01.09.2018)
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Conference Proceeding
(Invited) Conductive Bridging RAM (CBRAM): Then, Now, and Tomorrow
Jameson, John R., Blanchard, Philippe, Dinh, John, Gonzales, Nathan, Gopalakrishnan, Vasudevan, Guichet, Berenice, Hollmer, Shane, Hsu, Sue, Intrater, Gideon, Kamalanathan, Deepak, Kim, David, Koushan, Foroozan, Kwan, Ming, Lewis, Derric, Pedersen, Bård, Ramsbey, Mark, Runnion, Ed, Shields, Jeffrey, Tsai, Kevin, Tysdal, Aaron, Wang, Daniel, Gopinath, Venkatesh
Published in ECS transactions (19.08.2016)
Published in ECS transactions (19.08.2016)
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Journal Article
Demonstration of Conductive Bridging Random Access Memory (CBRAM) in logic CMOS process: Special Issue Devoted to the 2nd International Memory Workshop (IMW 2010)
GOPALAN, C, MA, Y, GALLO, T, WANG, J, RUNNION, E, SAENZ, J, KOUSHAN, F, BLANCHARD, P, HOLLMER, S
Published in Solid-state electronics (2011)
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Published in Solid-state electronics (2011)
Journal Article
Demonstration of Conductive Bridging Random Access Memory (CBRAM) in Logic CMOS Process
Gopalan, C, Yi Ma, Gallo, T, Wang, J, Runnion, E, Saenz, J, Koushan, F, Hollmer, S
Published in 2010 IEEE International Memory Workshop (01.05.2010)
Published in 2010 IEEE International Memory Workshop (01.05.2010)
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Conference Proceeding
Limitations on oxide thicknesses in flash EEPROM applications
Runnion, E.F., Gladstone, S.M., Scott, R.S., Dumin, D.J., Lie, L., Mitros, J.
Published in Proceedings of International Reliability Physics Symposium (1996)
Published in Proceedings of International Reliability Physics Symposium (1996)
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