by Gopalan, C., Ma, Y., Gallo, T., Wang, J., Runnion, E., Saenz, J., Koushan, F., Blanchard, P., Hollmer, S.
Published in Solid-state electronics (01.04.2011)

by Runnion, E.F., Gladstone, S.M., Scott, R.S., Dumin, D.J., Lie, L., Mitros, J.C.
Published in IEEE transactions on electron devices (01.06.1997)

by Jameson, J. R., Blanchard, P., Cheng, C., Dinh, J., Gallo, A., Gopalakrishnan, V., Gopalan, C., Guichet, B., Hsu, S., Kamalanathan, D., Kim, D., Koushan, F., Kwan, M., Law, K., Lewis, D., Ma, Y., McCaffrey, V., Park, S., Puthenthermadam, S., Runnion, E., Sanchez, J., Shields, J., Tsai, K., Tysdal, A., Wang, D., Williams, R., Kozicki, M. N., Wang, J., Gopinath, V., Hollmer, S., Van Buskirk, M.
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)

by Jameson, J.R., Dinh, J., Gonzales, N., Hollmer, S., Hsu, S., Kim, D., Koushan, F., Lewis, D., Runnion, E., Shields, J., Tysdal, A., Wang, D., Gopinath, V.
Published in 2018 48th European Solid-State Device Research Conference (ESSDERC) (01.09.2018)

by Jameson, John R., Blanchard, Philippe, Dinh, John, Gonzales, Nathan, Gopalakrishnan, Vasudevan, Guichet, Berenice, Hollmer, Shane, Hsu, Sue, Intrater, Gideon, Kamalanathan, Deepak, Kim, David, Koushan, Foroozan, Kwan, Ming, Lewis, Derric, Pedersen, Bård, Ramsbey, Mark, Runnion, Ed, Shields, Jeffrey, Tsai, Kevin, Tysdal, Aaron, Wang, Daniel, Gopinath, Venkatesh
Published in ECS transactions (19.08.2016)

by GOPALAN, C, MA, Y, GALLO, T, WANG, J, RUNNION, E, SAENZ, J, KOUSHAN, F, BLANCHARD, P, HOLLMER, S
Published in Solid-state electronics (2011)

by Fleming, J.F., Guydish, J.J., Pentz, J.R., Runnion, C.E., Anderson, G.P.
Published in Engineering fracture mechanics (1980)

by Gopalan, C, Yi Ma, Gallo, T, Wang, J, Runnion, E, Saenz, J, Koushan, F, Hollmer, S
Published in 2010 IEEE International Memory Workshop (01.05.2010)

by ERNEST E. RUNNION
Year of Publication 04.01.1972

by ERNEST E. RUNNION
Year of Publication 15.04.1969

by Runnion, E.F., Gladstone, S.M., Scott, R.S., Dumin, D.J., Lie, L., Mitros, J.
Published in Proceedings of International Reliability Physics Symposium (1996)

by MELIK-MARTIROSIAN ASHOT, RUNNION ED, RANDOLPH MARK, DING MENG
Year of Publication 04.10.2011

by MELIK-MARTIROSIAN ASHOT, RUNNION ED, RANDOLPH MARK, DING MENG
Year of Publication 04.02.2010

by MELIK-MARTIROSIAN ASHOT, RUNNION ED, RANDOLPH MARK, DING MENG
Year of Publication 08.12.2009

by RUNNION ED, MELIK MARTIROSIAN ASHOT, RANDOLPH MARK, DING MENG
Year of Publication 06.04.2009

by RUNNION, ED, DING, MENG, MELIK-MARTIROSIAN, ASHOT, RANDOLPH, MARK
Year of Publication 18.10.2007

by MELIK-MARTIROSIAN ASHOT, RUNNION ED, RANDOLPH MARK, DING MENG
Year of Publication 11.10.2007

by ED RUNNION, MARK RANDOLPH, MELIK MARTIROSIAN ASHOT, MENG DIN
Year of Publication 06.08.2014

by MELIK-MARTIROSIAN ASHOT, RUNNION ED, RANDOLPH MARK, DING MENG
Year of Publication 04.06.2014

by RUNNION ERNEST E
Year of Publication 05.07.1966