by Warnock, J., Yiu-Hing Chan, Carey, S., Huajun Wen, Meaney, P., Gerwig, G., Smith, H. H., Yuen Chan, Davis, J., Bunce, P., Pelella, A., Rodko, D., Patel, P., Strach, T., Malone, D., Malgioglio, F., Neves, J., Rude, D. L., Huott, W.
Published in IEEE journal of solid-state circuits (01.01.2012)

by Warnock, James, Yuen Chan, Harrer, Hubert, Carey, Sean, Salem, Gerard, Malone, Doug, Puri, Ruchir, Zitz, Jeffrey A., Jatkowski, Adam, Strevig, Gerald, Datta, Ayan, Gattiker, Anne, Bansal, Aditya, Mayer, Guenter, Yiu-Hing Chan, Mayo, Mark, Rude, David L., Sigal, Leon, Strach, Thomas, Smith, Howard H., Huajun Wen, Pak-kin Mak, Shum, C-L Kevin, Plass, Donald, Webb, Charles
Published in IEEE journal of solid-state circuits (01.01.2014)

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