by Arz, U., Williams, D.F., Walker, D.K., Rogers, J.E., Rudack, M., Treytnar, D., Grabinski, H.
Published in 2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017) (2000)

by Rudack, M., Meincke, M., Jobmann, K., Lott, M.
Published in 2003 IEEE 58th Vehicular Technology Conference. VTC 2003-Fall (IEEE Cat. No.03CH37484) (2003)

by Redeker, M., Rudack, M., Lobe, T., Niggemeyer, D.
Published in Records of the IEEE International Workshop on Memory Technology, Design and Testing (2000)

by Rudack, M., Redeker, M., Treytnar, D., Mende, O., Herrmann, K.
Published in Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2000)

by Rudack, M., Jobmann, K., Pajares, A., Esteve, M.
Published in NOMS 2002. IEEE/IFIP Network Operations and Management Symposium. ' Management Solutions for the New Communications World'(Cat. No.02CH37327) (2002)

by Rudack, M., Redeker, M., Hilgenstock, J., Moch, S., Castagne, J.
Published in IEEE design & test of computers (01.01.2002)

by Mende, O., Redeker, M., Rudack, M., Treytnar, D.
Published in Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2000)

by Rudack, M., Niggemeyer, D.
Published in Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) (1999)

by Rudack, Maximilian M, Buhrig-Polaczek, Andreas, Vroomen, Uwe
Published in Modern casting (01.09.2019)

by Rudack, Maximilian M, Bührig-Polaczek, Andreas, Vroomen, Uwe
Published in Modern Casting (01.09.2019)