Insight Into a Generic Interconnect Resource Model for Xilinx Virtex and Spartan Series FPGAs
Ruan, A, Yang, J, Wan, L, Jie, B, Tian, Z
Published in IEEE transactions on circuits and systems. II, Express briefs (01.11.2013)
Published in IEEE transactions on circuits and systems. II, Express briefs (01.11.2013)
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Journal Article
A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA test and diagnosis
Ruan, Aiwu, Kang, Shi, Wang, Yu, Han, Xiao, Zhu, Zujian, Liao, Yongbo, Li, Peng
Published in Microelectronics and reliability (01.03.2013)
Published in Microelectronics and reliability (01.03.2013)
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Journal Article
A bitstream readback-based automatic functional test and diagnosis method for Xilinx FPGAs
Ruan, Aiwu, Jie, Bairui, Wan, Li, Yang, Junhao, Xiang, Chuanyin, Zhu, Zujian, Wang, Yu
Published in Microelectronics and reliability (01.08.2014)
Published in Microelectronics and reliability (01.08.2014)
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Journal Article
A new event driven testbench synthesis engine for FPGA emulation
Haocheng Huang, Aiwu Ruan, Yongbo Liao, Jianhua Zhu, Lin Wang, Chuanyin Xiang, Pin Li
Published in 2011 9th IEEE International Conference on ASIC (01.10.2011)
Published in 2011 9th IEEE International Conference on ASIC (01.10.2011)
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Conference Proceeding
Interconnect resources testing and faults diagnosis in field programmable gate arrays
Liao Yongbo, Ruan Aiwu, Wang Yu, Xiang Chuanyin, Wang Lin, Huang Haocheng, Zhu Jianhua
Published in IEEE 2011 10th International Conference on Electronic Measurement & Instruments (01.08.2011)
Published in IEEE 2011 10th International Conference on Electronic Measurement & Instruments (01.08.2011)
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Conference Proceeding