Reverse bias stress test of GaN HEMTs for high-voltage switching applications
Dammann, M., Czap, H., Ruster, J., Baeumler, M., Gutle, F., Waltereit, P., Benkhelifa, F., Reiner, R., Casar, M., Konstanzer, H., Muller, S., Quay, R., Mikulla, M., Ambacher, O.
Published in 2012 IEEE International Integrated Reliability Workshop Final Report (01.10.2012)
Published in 2012 IEEE International Integrated Reliability Workshop Final Report (01.10.2012)
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Conference Proceeding
DETERMINING COSTS OF CLERICAL FUNCTIONS IN A SMALL OFFICE
Ruster, John J
Published in National Association of Cost Accountants. NACA Bulletin (pre-1986) (01.05.1948)
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Published in National Association of Cost Accountants. NACA Bulletin (pre-1986) (01.05.1948)
Trade Publication Article
Measuring device for chairs
ALLIE; PAUL F, WILLIAMS; JAMES M, VAN DE RIET; MARY BETH, TRINKEL; STEVEN F, SUZUKI; JAMES K. G, RUSTER; RANDY J, KOKOT; DOUGLAS D
Year of Publication 15.10.1996
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Year of Publication 15.10.1996
Patent