Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics-Part I: Experimental
Ullmann, Bianka, Jech, Markus, Puschkarsky, Katja, Rott, Gunnar Andreas, Waltl, Michael, Illarionov, Yury, Reisinger, Hans, Grasser, Tibor
Published in IEEE transactions on electron devices (01.01.2019)
Published in IEEE transactions on electron devices (01.01.2019)
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Journal Article
Mixture of negative bias temperature instability and hot-carrier driven threshold voltage degradation of 130 nm technology p-channel transistors
ROTT, Gunnar Andreas, ROTT, Karina, REISINGER, Hans, GUSTIN, Wolfgang, GRASSER, Tibor
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Conference Proceeding
Journal Article
Mixture of negative bias temperature instability and hot-carrier driven threshold voltage degradation of 130nm technology p-channel transistors
Rott, Gunnar Andreas, Rott, Karina, Reisinger, Hans, Gustin, Wolfgang, Grasser, Tibor
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Journal Article
Drift compensating effect during hot-carrier degradation of 130nm technology dual gate oxide P-channel transistors
Rott, Gunnar Andreas, Nielen, Heiko, Reisinger, Hans, Gustin, Wolfgang, Tyaginov, Stanislav, Grassersstrae, Tibor
Published in 2013 IEEE International Integrated Reliability Workshop Final Report (01.10.2013)
Published in 2013 IEEE International Integrated Reliability Workshop Final Report (01.10.2013)
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Conference Proceeding