by Ross, Alan W.S., Dover, Coinneach M., Smith, Stewart, Terry, Jonathan G., Mount, Andrew R., Walton, Anthony J.
Published in 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) (21.03.2022)

by Yifan Li, Parkes, W., Haworth, L.I., Ross, A., Stevenson, J., Walton, A.J.
Published in Journal of microelectromechanical systems (01.12.2008)

by Smith, S., McCallum, M., Walton, A.J., Stevenson, J.T.M., Harris, P.D., Ross, A.W.S., Hourd, A.C., Liudi Jiang
Published in IEEE transactions on semiconductor manufacturing (01.05.2005)

by Smith, S., Walton, A.J., Bond, S., Ross, A.W.S., Stevenson, J.T.M., Gundlach, A.M.
Published in IEEE transactions on semiconductor manufacturing (01.05.2003)

by Smith, S., Walton, A.J., Ross, A.W.S., Bodammer, G.K.H., Stevenson, J.T.M.
Published in IEEE transactions on semiconductor manufacturing (01.05.2002)