by Smith, S., McCallum, M., Walton, A.J., Stevenson, J.T.M., Harris, P.D., Ross, A.W.S., Hourd, A.C., Liudi Jiang
Published in IEEE transactions on semiconductor manufacturing (01.05.2005)

by Smith, S., Walton, A.J., Ross, A.W.S., Bodammer, G.K.H., Stevenson, J.T.M.
Published in IEEE transactions on semiconductor manufacturing (01.05.2002)

by Smith, S., Walton, A.J., Bond, S., Ross, A.W.S., Stevenson, J.T.M., Gundlach, A.M.
Published in IEEE transactions on semiconductor manufacturing (01.05.2003)

by Smith, S., Walton, A.J., McCallum, M., Hourd, A.C., Stevenson, J.T.M., Ross, A.W.S.
Published in Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005 (2005)

by Enderling, S., Brown, C.L., Smith, S., Dicks, M.H., Stevenson, J.T.M., Ross, A.W.S., Mitkova, M., Kozicki, M.N., Walton, A.J.
Published in Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005 (2005)

by Shulver, B.J.R., Bunting, A.S., Gundlach, A.M., Haworth, L.I., Ross, A.W.S., Smith, S., Snell, A.J., Stevenson, J.T.M., Walton, A.J., Allen, R.A., Cresswell, M.W.
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)

by Shulver, B.J.R., Allen, R.A., Walton, A.J., Cresswell, M.W., Stevenson, J.T.M., Smith, S., Bunting, A.S., Dunare, C., Gundlach, A.M., Haworth, L.I., Ross, A.W.S., Snell, A.J.
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)

by Shulver, B.J.R., Bunting, A.S., Gundlach, A.M., Haworth, L.I., Ross, A.W.S., Snell, A.J., Stevenson, J.T.M., Walton, A.J., Allen, R.A., Cresswell, M.W.
Published in 2006 IEEE International Conference on Microelectronic Test Structures (2006)

by Reeves, C.M., Turcu, I.C.E., Stevenson, J.T.M., Ross, A.W.S., Gundlach, A.M., Prewett, P., Lawes, R.A., Anastasi, P., Burge, R., Michell, P.
Published in Microelectronic engineering (01.01.1996)

by Fallon, M., Walton, A.J., Stevenson, J.T.M., Ross, A.W.S.
Published in IEEE transactions on semiconductor manufacturing (01.08.1994)

by Li, Y, Li, P, Kazantzis, A, Haworth, L.I, Muir, K, Ross, A.W.S, Terry, J.G, Stevenson, J.T.M, Gundlach, A.M, Bunting, A, Walton, A.J
Published in IET Seminar on MEMS Sensors and Actuators (2006)

by Smith, S., Walton, A.J., Ross, A.W.S., Bodammer, G.K.H., Stevenson, J.T.M.
Published in ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) (2001)

by Smith, S., McCallum, M., Walton, A.J., Stevenson, J.T.M., Harris, P.D., Ross, A.W.S., Hourd, A.C., Jiang, L.
Published in Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) (2004)

by Smith, S., Walton, A.J., Bond, S., Ross, A.W.S., Stevenson, J.T.M., Gundlach, A.M.
Published in Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002 (2002)

by Walton, A.J., Fallon, M., Stevenson, J.T.M., Ross, A.W.S., Reeves, C.M.
Published in Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures (1994)

by Walton, A.J., Fallon, M., Stevenson, J.T.M., Ross, A.W.S.
Published in ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures (1993)