Low-temperature off-state bipolar effect in floating-body PD/SOI MOSFETs
Pelella, M.M., Fossum, J.G., Chuang, C.T., Torreiter, O.A., Schettler, H., Puri, R., Ketchen, M.B., Rosenfield, M.G.
Published in 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) (2000)
Published in 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) (2000)
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Conference Proceeding
Improved underlayers for acid amplified resists
Sachdev, H.S., Kwong, R.W., Katnani, A., Kwietniak, K.T., Rosenfield, M.G., Coane, P.J.
Published in Microelectronic engineering (1994)
Published in Microelectronic engineering (1994)
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Journal Article
Determination of proximity effect correction parameters for 0.1 μm electron-beam lithography
Rosenfield, M.G., Wind, S.J., Molzen, W.W., Gerber, P.D.
Published in Microelectronic engineering (1990)
Published in Microelectronic engineering (1990)
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Journal Article
Conference Proceeding
Hysteresis in floating-body PD/SOI CMOS circuits
Pelella, M.M., Chuang, C.T., Tretz, C., Curran, B.W., Rosenfield, M.G.
Published in 1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453) (1999)
Published in 1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453) (1999)
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Conference Proceeding
Performance analysis of tapered gate in PD/SOI CMOS technology
Hwang, W., Chuang, C.T., Curran, B.W., Rosenfield, M.G.
Published in 2001 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers (Cat. No.01TH8517) (2001)
Published in 2001 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers (Cat. No.01TH8517) (2001)
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Conference Proceeding
SOI for a 1-volt CMOS technology and application to a 512 Kb SRAM with 3.5 ns access time
Shahidi, G.G., Ning, T.H., Chappell, T.I., Comfort, J.H., Chappell, B.A., Franch, R., Anderson, C.J., Cook, P.W., Schuster, S.E., Rosenfield, M.G., Polcari, M.R., Dennard, R.H., Davari, B.
Published in Proceedings of IEEE International Electron Devices Meeting (1993)
Published in Proceedings of IEEE International Electron Devices Meeting (1993)
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A high performance 0.25 mu m CMOS technology
Davari, B., Chang, W.H., Wordeman, M.R., Oh, C.S., Taur, Y., Petrillo, K.E., Moy, D., Bucchignano, J.J., Ng, H.Y., Rosenfield, M.G., Hohn, F.J., Rodriguez, M.D.
Published in Technical Digest., International Electron Devices Meeting (1988)
Published in Technical Digest., International Electron Devices Meeting (1988)
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