by van Delft, F.C.M.J.M., van der Kruis, F.J.H., Roosen, H.H.A.J., van de Laar, H.W.J.J.
Published in Microelectronic engineering (01.05.2008)

by Roy, D., Klootwijk, J.H., Verhaegh, N.A.M., Roosen, H.H.A.J., Wolters, R.A.M.
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)