Anomalous single bit retention induced by asymmetric STI-corner-thinning for floating gate Flash memories
Ming-Yi Lee, Wei-Hao Hsiao, Ru-Ping Chen, Li-Kuang Kuo, Sheng-Qian Dai, Rong-Cyuan Ting, Chih-Lin Chen, Da-Gang Chu, Chih-Yuan Lu
Published in 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2012)
Published in 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2012)
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