Reliability of industrial packaging for microsystems
de Reus, R., Christensen, C., Weichel, S., Bouwstra, S., Janting, J., Friis Eriksen, G., Dyrbye, K., Romedahl Brown, T., Krog, J.P., Søndergård Jensen, O., Gravesen, P.
Published in Microelectronics and reliability (01.06.1998)
Published in Microelectronics and reliability (01.06.1998)
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