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"Romanjuk, Boris"
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"Romanjuk, Boris"
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Reference sample used for quantitatively determining surface contamination comprises a substrate having a reference contamination consisting of at least one chemical element
by
KURPS, RAINER
,
ROMANJUK
,
BORIS
,
KRUEGER, DIETMAR
,
MELNIK, VIKTOR
Year of Publication
15.05.2003
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Method of fabricating ion implanted doping layers in semiconductor materials and integrated circuits made therefrom
by
KURPS RAINER
,
KRUEGER DIETMAR
,
ROMANJUK BORIS
,
OLICH JAROSLAV
,
MELNIK VIKTOR
Year of Publication
19.03.2002
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Method of fabricating ion implanted doping layers in semiconductor materials and integrated circuits made therefrom
by
Krueger, Dietmar
,
Kurps, Rainer
,
Romanjuk
,
Boris
,
Melnik, Viktor
,
Olich, Jaroslav
Year of Publication
19.03.2002
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Referenzprobe zur quantitativen Bestimmung von Oberflächenkontaminationen und Verfahren zu ihrer Herstellung
by
KURPS, RAINER
,
ROMANJUK
,
BORIS
,
KRUEGER, DIETMAR
,
MELNIK, VIKTOR
Year of Publication
01.06.2006
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Forming trenched monocrystalline silicon carbide layer in substrate
by
KRUEGER, DIETMAR., 15236 FRANKFURT, DE
,
ROMANJUK
,
BORIS
, KIEW/KIEV, UA
,
LITOVCHENKO, VLADIMIR, KIEW/KIEV, UA
,
KLYUI, NIKOLAI, KIEW/KIEV, UA
,
RICHTER, HANS., 15236 FRANKFURT, DE
Year of Publication
22.02.1996
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basic electric elements
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