Improved interface characteristics of Mo/SiO2/4H-SiC metal-oxide-semiconductor with post-metallization annealing
Lee, Jae-Gil, Kim, Dong-Hwan, Eom, Su-Keun, Roh, Seung-Hyun, Seo, Kwang-Seok, Kim, Hyun-Seop, Kim, Hyungtak, Cha, Ho-Young, Byun, Young-Chul
Published in Journal of the Korean Physical Society (2018)
Published in Journal of the Korean Physical Society (2018)
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Journal Article
Normally-off AlGaN/GaN-on-Si metal-insulator-semiconductor heterojunction field-effect transistor with nitrogen-incorporated silicon oxide gate insulator
Roh, Seung-Hyun, Eom, Su-Keun, Choi, Gwang-Ho, Kang, Myoung-Jin, Kim, Dong-Hwan, Hwang, Il-Hwan, Seo, Kwang-Seok, Lee, Jae-Gil, Byun, Young-Chul, Cha, Ho-Young
Published in Journal of the Korean Physical Society (01.08.2017)
Published in Journal of the Korean Physical Society (01.08.2017)
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Journal Article