by Pritchard, K., Chabot, J. P., Robucci, R., Choa, F. S., Osovizky, A., Ziegler, J., Binkley, E., Tsai, P., Hadad, N., Jackson, M., Hurlbut, C., Baltic, G. M., Majkrzak, C. F., Maliszewskyj, N. C.
Published in IEEE transactions on nuclear science (01.07.2021)

by BANDYOPADHYAY, Abhishek, LEE, Jungwon, ROBUCCI, Ryan W, HASLER, Paul
Published in IEEE journal of solid-state circuits (01.03.2006)

by Pritchard, K., Chabot, J.P., Tsai, P., Robucci, R., Choa, F.S., Osovizky, A., Ziegler, J., Binkley, E., Hadad, N., Jackson, M., Hurlbut, C., Baltic, G.M., Majkrzak, C.F., Maliszewskyj, N.C.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (11.06.2021)

by Rao, S. K., Robucci, R., Patel, C.
Published in 2013 IEEE 31st VLSI Test Symposium (VTS) (01.04.2013)

by Basu, A., Robucci, R.W., Hasler, P.E.
Published in IEEE transactions on circuits and systems. I, Regular papers (01.10.2007)

by Bandyopadhyay, A, Lee, Jungwon, Robucci, R W, Hasler, P
Published in IEEE journal of solid-state circuits (01.03.2006)

by Robucci, R., Leung Kin Chiu, Gray, J., Romberg, J., Hasler, P., Anderson, D.
Published in 2008 IEEE International Conference on Acoustics, Speech and Signal Processing (01.03.2008)

by Rao, S. K., Sathyanarayana, C., Kallianpur, A., Robucci, R., Patel, C.
Published in 2012 IEEE 30th VLSI Test Symposium (VTS) (01.04.2012)

by Gray, J., Robucci, R., Hasler, P.
Published in 2008 51st Midwest Symposium on Circuits and Systems (01.08.2008)

by Bandyopadhyay, A., Lee, J., Robucci, R., Hasler, P.
Published in 2005 IEEE International Symposium on Circuits and Systems (ISCAS) (2005)

by Teahyung Lee, Leung Kin Chiu, Anderson, D.V., Robucci, R., Hasler, P.
Published in 2007 50th Midwest Symposium on Circuits and Systems (01.08.2007)

by Jungwon Lee, Bandyopadhyay, A., Faik Baskaya, I., Robucci, R., Hasler, P.
Published in Proceedings. (ICASSP '05). IEEE International Conference on Acoustics, Speech, and Signal Processing, 2005 (2005)

by Robucci, R, Gray, J, Abramson, D, Hasler, P E
Published in 2008 IEEE International Symposium on Circuits and Systems (01.01.2008)