A novel pin-pull tester and its application on PCB pad cratering assessment
Nanbo Li, Miao Cai, Jianna Zheng, Shunfeng Han, Riyang Deng, Boyi Wu, Dongji Xie, Daoguo Yang
Published in 2015 16th International Conference on Electronic Packaging Technology (ICEPT) (01.08.2015)
Published in 2015 16th International Conference on Electronic Packaging Technology (ICEPT) (01.08.2015)
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