EPID and EPIA - the first epidemiological studies on depression and anxiety disorders in Slovakia
Novotny, V, Heretik,, A, Pecenak, J, Ritomsky, A
Published in Journal of affective disorders (01.04.2010)
Published in Journal of affective disorders (01.04.2010)
Get full text
Journal Article
Advanced patterning techniques for nanodevice fabrication
KOSTIC, I, ANDOK, R, BARAK, V, CAPLOVIC, I, KONECNIKOVA, A, MATAY, L, HRKUT, P, RITOMSKY, A
Published in Journal of materials science. Materials in electronics (01.10.2003)
Published in Journal of materials science. Materials in electronics (01.10.2003)
Get full text
Conference Proceeding
Journal Article
P.4.f.003 EPIA -anxiety as a trait in Slovakia
Heretik, A., Novotny, V., Heretik, A., Pecenak, J., Ritomsky, A.
Published in European neuropsychopharmacology (2006)
Published in European neuropsychopharmacology (2006)
Get full text
Journal Article
Study of negative electron beam nanoresist HSQ on GaAs substrate
Andok, R., Bencurova, A., Kostic, I., Ritomsky, A., Skriniarova, J., Vutova, K.
Published in 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) (01.11.2016)
Published in 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) (01.11.2016)
Get full text
Conference Proceeding
Material optimization of the alignment marks for the EBDW lithography
Matay, L, Andok, R, Barák, V, Ritomský, A, Konečniková, A, Kostič, I, Partel, S, Hudek, P
Published in The Eighth International Conference on Advanced Semiconductor Devices and Microsystems (01.10.2010)
Published in The Eighth International Conference on Advanced Semiconductor Devices and Microsystems (01.10.2010)
Get full text
Conference Proceeding
Estimation of exposure parameters of chosen e-beam resists using variable shaped e-beam pattern generator
Andok, R., Matay, L., Kostic, I., Bencurova, A., Nemec, P., Konecnikova, A., Ritomsky, A.
Published in The Ninth International Conference on Advanced Semiconductor Devices and Mircosystems (01.11.2012)
Published in The Ninth International Conference on Advanced Semiconductor Devices and Mircosystems (01.11.2012)
Get full text
Conference Proceeding