Search Results - "Ritchie, Nicholas WM" :: K.UTB vyhledávací portál

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Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)

by Newbury, Dale E., Ritchie, Nicholas W. M.
Published in Journal of materials science (01.01.2015)

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Is Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry (SEM/EDS) Quantitative?

by Newbury, Dale E., Ritchie, Nicholas W. M.
Published in Scanning (01.05.2013)

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SEM-EDS of Artifacts from the HMAV Bounty Discovered at Pitcairn Island

by Lindstrom, Abigail P, Ritchie, Nicholas WM
Published in Microscopy and microanalysis (01.08.2019)

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Embracing Uncertainty: Modeling Uncertainty in EPMA—Part II

by Ritchie, Nicholas W.M.
Published in Microscopy and microanalysis (01.02.2021)

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Electron-Excited X-ray Microanalysis by Energy Dispersive Spectrometry at 50: Analytical Accuracy, Precision, Trace Sensitivity, and Quantitative Compositional Mapping

by Newbury, Dale E., Ritchie, Nicholas W.M.
Published in Microscopy and microanalysis (01.10.2019)

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Quantitative Electron-Excited X-ray Microanalysis With Low-Energy L-shell X-ray Peaks Measured With Energy-Dispersive Spectrometry

by Newbury, Dale E., Ritchie, Nicholas W.M.
Published in Microscopy and microanalysis (01.12.2021)

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Exploring the Limits of EDS Microanalysis for Rare Earth Element Analyses

by Ritchie, Nicholas W.M., Lowers, Heather A.
Published in Microscopy and microanalysis (01.08.2018)

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Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-II

by Newbury, Dale E., Ritchie, Nicholas W. M.
Published in Microscopy and microanalysis (01.10.2015)

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Electron-Excited X-Ray Microanalysis at Low Beam Energy: Almost Always an Adventure!

by Newbury, Dale E., Ritchie, Nicholas W.M.
Published in Microscopy and microanalysis (01.08.2016)

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Measurement of Trace Constituents by Electron-Excited X-Ray Microanalysis with Energy-Dispersive Spectrometry

by Newbury, Dale E., Ritchie, Nicholas W. M.
Published in Microscopy and microanalysis (01.06.2016)

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Diluvian Clustering: A Fast, Effective Algorithm for Clustering Compositional and Other Data

by Ritchie, Nicholas W. M.
Published in Microscopy and microanalysis (01.10.2015)

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Use of force-sensing array films to improve surface wipe sampling

by Verkouteren, Jennifer R, Ritchie, Nicholas W. M, Gillen, Greg
Published in Environmental science--processes & impacts (01.01.2013)

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Detecting Difficult Minor Elements in Particle Samples by SEM-EDS

by Lindstrom, Abigail P., Ritchie, Nicholas WM
Published in Microscopy and microanalysis (01.08.2014)

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Homogeneity and Sample Preparation from Grams to Microns using NAA, uXRF, and SEM-EDS

by Lindstrom, Abigail P., Davis, Jeffrey M., Zeisler, Rolf, Ritchie, Nicholas WM, Lindstrom, Richard M.
Published in Microscopy and microanalysis (01.08.2015)

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