A 4.6-μm, 127-dB Dynamic Range, Ultra-Low Power Stacked Digital Pixel Sensor With Overlapped Triple Quantization
Ikeno, Rimon, Mori, Kazuya, Uno, Masayuki, Miyauchi, Ken, Isozaki, Toshiyuki, Takayanagi, Isao, Nakamura, Junichi, Wuu, Shou-Gwo, Bainbridge, Lyle, Berkovich, Andrew, Chen, Song, Chilukuri, Ramakrishna, Gao, Wei, Tsai, Tsung-Hsun, Liu, Chiao
Published in IEEE transactions on electron devices (01.06.2022)
Published in IEEE transactions on electron devices (01.06.2022)
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Journal Article
A 3.96- \mu m, 124-dB Dynamic-Range, Digital-Pixel Sensor With Triple-and Single-Quantization Operations for Monochrome and Near-Infrared Dual-Channel Global Shutter Operation
Miyauchi, Ken, Uno, Masayuki, Isozaki, Toshiyuki, Fukuhara, Hideyuki, Mori, Kazuya, Abe, Hirofumi, Nagamatsu, Masato, Ikeno, Rimon, Takayanagi, Isao, Chen, Hsin-Li, Lin, Chih-Hao, Fu, Wen-Chien, Wuu, Shou-Gwo, Chen, Song, Bainbridge, Lyle, Chao, Qing, Chilukuri, Ramakrishna, Gao, Wei, Hammond, Andrew P., Tsai, Tsung-Hsun, Liu, Chiao
Published in IEEE journal of solid-state circuits (04.10.2024)
Published in IEEE journal of solid-state circuits (04.10.2024)
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Journal Article
Experimental demonstration of stochastic comparators for fine resolution ADC without calibration
Nguyen Ngoc Mai-Khanh, Ikeno, Rimon, Yamaguchi, Takahiro J., Iizuka, Tetsuya, Asada, Kunihiro
Published in 2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) (01.12.2016)
Published in 2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) (01.12.2016)
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Conference Proceeding
Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer Environment
Terao, Naoki, Nakura, Toru, Ishida, Masahiro, Ikeno, Rimon, Kusaka, Takashi, Iizuka, Tetsuya, Asada, Kunihiro
Published in Journal of electronic testing (01.04.2018)
Published in Journal of electronic testing (01.04.2018)
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Journal Article
A 3.96μm, 124dB Dynamic Range, 6.2mW Stacked Digital Pixel Sensor with Monochrome and Near-Infrared Dual-Channel Global Shutter Capture
Chen, Song, Liu, Chiao, Bainbridge, Lyle, Chao, Qing, Chilukuri, Ramakrishna, Gao, Wei, Hammond, Andrew P., Tsai, Tsung-Hsun, Miyauchi, Ken, Takayanagi, Isao, Nagamatsu, Masato, Abe, Hirofumi, Mori, Kazuya, Uno, Masayuki, Isozaki, Toshiyuki, Ikeno, Rimon, Chen, Hsin-Li, Lin, Chih-Hao, Fu, Wen-Chien, Wuu, Shou-Gwo
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
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Conference Proceeding
An arrayed test structure for transistor damage assessment induced by circuit analysis and repairing processes with back-side-accessing Focused Ion Beam
Usami, Naoto, Kinoshita, Jun, Ikeno, Rimon, Okamoto, Yuki, Tanno, Masaaki, Asada, Kunihiro, Mita, Yoshio
Published in 2017 International Conference of Microelectronic Test Structures (ICMTS) (01.03.2017)
Published in 2017 International Conference of Microelectronic Test Structures (ICMTS) (01.03.2017)
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Conference Proceeding
A Consideration on LUT Linearization of Stochastic ADC in Sub-Ranging Architecture
Kanjanavirojkul, Parit, Nguyen Ngoc Mai-Khanh, Rimon, Ikeno, Yamaguchi, Takahiro J., Iizuka, Tetsuya, Asada, Kunihiro
Published in 2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS) (01.08.2018)
Published in 2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS) (01.08.2018)
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Conference Proceeding
A Technique for Analyzing On-Chip Power Supply Impedance
Ishida, Masahiro, Nakura, Toru, Matsukawa, Akira, Ikeno, Rimon, Asada, Kunihiro
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
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Conference Proceeding
Journal Article
Power supply impedance emulation to eliminate overkills and underkills due to the impedance difference between ATE and customer board
Nakura, Toru, Terao, Naoki, Ishida, Masahiro, Ikeno, Rimon, Kusaka, Takashi, Iizuka, Tetsuya, Asada, Kunihiro
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
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Conference Proceeding
Test structures for nano-gap fabrication process development for nano-electromechanical systems
Smith, Stewart, Takeshiro, Yudai, Okamoto, Yuki, Terry, Jonathan G., Walton, Anthony J., Ikeno, Rimon, Asada, Kunihiro, Mita, Yoshio
Published in 2017 International Conference of Microelectronic Test Structures (ICMTS) (01.03.2017)
Published in 2017 International Conference of Microelectronic Test Structures (ICMTS) (01.03.2017)
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Conference Proceeding
COOL interconnect low power interconnection technology for scalable 3D LSI design
Chacin, M., Uchida, H., Hagimoto, M., Miyazaki, T., Ohkawa, T., Ikeno, R., Matsumoto, Y., Imura, F., Suzuki, M., Kikuchi, K., Nakagawa, H., Aoyagi, M.
Published in 2011 IEEE Cool Chips XIV (01.04.2011)
Published in 2011 IEEE Cool Chips XIV (01.04.2011)
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Conference Proceeding
SYSTEM, METHOD, DEVICE AND DATA STRUCTURE FOR DIGITAL PIXEL SENSORS
IKENO, Rimon, MIYAUCHI, Ken, MORI, Kazuya, UNO, Masayuki, OWADA, Hideki
Year of Publication 21.09.2023
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Year of Publication 21.09.2023
Patent
SYSTEM, METHOD, DEVICE AND DATA STRUCTURE FOR DIGITAL PIXEL SENSORS
IKENO, Rimon, MIYAUCHI, Ken, MORI, Kazuya, UNO, Masayuki, OWADA, Hideki
Year of Publication 21.09.2023
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Year of Publication 21.09.2023
Patent
SYSTEM, METHOD, DEVICE AND DATA STRUCTURE FOR DIGITAL PIXEL SENSORS
IKENO, Rimon, MIYAUCHI, Ken, MORI, Kazuya, UNO, Masayuki, OWADA, Hideki
Year of Publication 27.07.2023
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Year of Publication 27.07.2023
Patent
SYSTEM, METHOD, DEVICE AND DATA STRUCTURE FOR DIGITAL PIXEL SENSORS
IKENO, Rimon, MIYAUCHI, Ken, MORI, Kazuya, UNO, Masayuki, OWADA, Hideki
Year of Publication 29.03.2023
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Year of Publication 29.03.2023
Patent
SYSTEM, METHOD, DEVICE AND DATA STRUCTURE FOR DIGITAL PIXEL SENSORS
IKENO, Rimon, MIYAUCHI, Ken, MORI, Kazuya, UNO, Masayuki, OWADA, Hideki
Year of Publication 29.03.2023
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Year of Publication 29.03.2023
Patent
SYSTEM, METHOD, DEVICE AND DATA STRUCTURE FOR DIGITAL PIXEL SENSORS
IKENO, Rimon, MIYAUCHI, Ken, MORI, Kazuya, UNO, Masayuki, OWADA, Hideki
Year of Publication 29.03.2023
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Year of Publication 29.03.2023
Patent
A 4.6μm, 512×512, Ultra-Low Power Stacked Digital Pixel Sensor with Triple Quantization and 127dB Dynamic Range
Liu, Chiao, Bainbridge, Lyle, Berkovich, Andrew, Chen, Song, Gao, Wei, Tsai, Tsung-Hsun, Mori, Kazuya, Ikeno, Rimon, Uno, Masayuki, Isozaki, Toshiyuki, Tsai, Yu-Lin, Takayanagi, Isao, Nakamura, Junichi
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
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Conference Proceeding