Silicon Device Scaling to the Sub-10-nm Regime
Ieong, Meikei, Doris, Bruce, Kedzierski, Jakub, Rim, Ken, Yang, Min
Published in Science (American Association for the Advancement of Science) (17.12.2004)
Published in Science (American Association for the Advancement of Science) (17.12.2004)
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Journal Article
Transistor Mismatch Properties in Deep-Submicrometer CMOS Technologies
Xiaobin Yuan, Shimizu, T, Mahalingam, U, Brown, J S, Habib, K Z, Tekleab, D G, Tai-Chi Su, Satadru, S, Olsen, C M, Hyunwoo Lee, Li-Hong Pan, Hook, T B, Jin-Ping Han, Jae-Eun Park, Myung-Hee Na, Rim, K
Published in IEEE transactions on electron devices (01.02.2011)
Published in IEEE transactions on electron devices (01.02.2011)
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Journal Article
10nm high performance mobile SoC design and technology co-developed for performance, power, and area scaling
Sam Yang, Yanxiang Liu, Ming Cai, Jerry Bao, Peijie Feng, Xiangdong Chen, Lixin Ge, Jun Yuan, Jihong Choi, Ping Liu, Youseok Suh, Hao Wang, Jie Deng, Yandong Gao, Yang, Jackie, Xiao-Yong Wang, Da Yang, Zhu, John, Penzes, Paul, Song, S. C., Park, Chulyong, Sungwon Kim, Jedon Kim, Sunggun Kang, Terzioglu, Esin, Ken Rim, Chidi Chidambaram, P. R.
Published in 2017 Symposium on VLSI Technology (01.06.2017)
Published in 2017 Symposium on VLSI Technology (01.06.2017)
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Conference Proceeding
Reverse Temperature Dependence of Circuit Performance in High- \kappa/Metal-Gate Technology
Shu-Jen Han, Dechao Guo, Xinlin Wang, Mocuta, A.C., Henson, W.K., Ken Rim
Published in IEEE electron device letters (01.12.2009)
Published in IEEE electron device letters (01.12.2009)
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Journal Article
Dielectric isolated FinFETs on bulk substrate
Lu, Darsen, Kangguo Cheng, Morin, Pierre, Loubet, Nicolas, Hook, Terence, Dechao Guo, Khakifirooz, Ali, Oldiges, Phil, Doris, Bruce, Ken Rim, Jacob, Ajey, Huiming Bu, Khare, Mukesh
Published in 2014 SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (01.10.2014)
Published in 2014 SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (01.10.2014)
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Conference Proceeding
Strained Si Channel MOSFETs with Embedded Silicon Carbon Formed by Solid Phase Epitaxy
Yaocheng Liu, Gluschenkov, O., Jinghong Li, Madan, A., Ozcan, A., Byeong Kim, Dyer, T., Chakravarti, A., Chan, K., Lavoie, C., Popova, I., Pinto, T., Rovedo, N., Zhijiong Luo, Loesing, R., Henson, W., Ken Rim
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
An array of 4 complementary LC-VCOs with 51.4% W-Band coverage in 32nm SOI CMOS
Kim, D.D., Jonghae Kim, Choongyeun Cho, Plouchart, J.-O., Kumar, M., Woo-Hyeong Lee, Ken Rim
Published in 2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers (01.02.2009)
Published in 2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers (01.02.2009)
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Conference Proceeding
Strain for CMOS performance improvement
Chan, V., Ken Rim, Meikei Ieong, Sam Yang, Rajeev Malik, Young Way Teh, Min Yang, Qiqing
Published in Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005 (2005)
Published in Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005 (2005)
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Conference Proceeding
SOI CMOS Technology with 360GHz fT NFET, 260GHz fT PFET, and Record Circuit Performance for Millimeter-Wave Digital and Analog System-on-Chip Applications
Sungjae Lee, Jonghae Kim, Daeik Kim, Jagannathan, B., Choongyeun Cho, Johnson, J., Dufrene, B., Zamdmer, N., Wagner, L., Williams, R., Fried, D., Ken Rim, Pekarik, J., Springer, S., Plouchart, J.-O., Freeman, G.
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
Expanding Design Technology Co-Optimization Potentials with Back-Side Interconnect Innovation
Kim, Byung-Sung, Choi, Subin, Lee, Jung Han, Lee, Kwangmuk, Park, Jisoo, Kwon, Jiwook, Park, Saehan, Chun, Kwanyoung, Simka, Harsono, Kumar, Aravindh, Ul Karim, Muhammed Ahosan, Rim, Ken, Song, Jaihyuk
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
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Conference Proceeding
(Invited) Silicon Germanium FinFET Device Physics, Process Integration and Modeling Considerations
Lu, Darsen, Morin, Pierre, Sahu, Bhagawan, Hook, Terence B, Hashemi, Pouya, Scholze, Andreas, Kim, Bomsoo, Kerber, Pranita, Khakifirooz, Ali, Oldiges, Philip, Rim, Ken, Doris, Bruce
Published in ECS transactions (12.08.2014)
Published in ECS transactions (12.08.2014)
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Journal Article
An anomalous correlation between gate leakage current and threshold voltage fluctuation in advanced MOSFETs
Zihong Liu, Chang, P, Xiaojun Yu, Jie Deng, Shu-Jen Han, Shahidi, G, Haensch, W, Ken Rim
Published in 2010 International Electron Devices Meeting (01.12.2010)
Published in 2010 International Electron Devices Meeting (01.12.2010)
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Conference Proceeding
High Performance Mobile SoC Productization with Second-Generation 10-nm FinFET Technology and Extension to 8-nm Scaling
Yuan, Jun, Rim, Ken, Chen, Ying, Cai, Ming, Suh, Youseok, Choi, Jihong, Deng, Jie, Bao, Jerry, Song, Zhimin, Ge, Lixin, Wang, Hao, Wang, Xiao-Yong, Lin, Vicki, Kuo, Chihwei, Yang, Sam, Rabindranath, Ashwin, Siva, Shrihari, Bhadri, Prasad, Kim, Sungwon, Lee, Kwon, Cho, Soon, Kang, Sunggun, Oh, Saechoon, Kwon, S. D., Chen, Xiangdong, Penzes, Paul, Agashe, Parag, Miller, William, Chidambaram, P. R.
Published in 2018 IEEE Symposium on VLSI Technology (01.06.2018)
Published in 2018 IEEE Symposium on VLSI Technology (01.06.2018)
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Conference Proceeding
Improved effective switching current (IEFF+) and capacitance methodology for CMOS circuit performance prediction and model-to-hardware correlation
Xiaojun Yu, Shu-jen Han, Zamdmer, N., Jie Deng, Nowak, E.J., Rim, K.
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
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Conference Proceeding
Reverse Temperature Dependence of Circuit Performance in High- [Formula Omitted]/Metal-Gate Technology
Han, Shu-Jen, Guo, Dechao, Wang, Xinlin, Mocuta, A.C, Henson, W.K, Rim, Ken
Published in IEEE electron device letters (01.12.2009)
Published in IEEE electron device letters (01.12.2009)
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Journal Article
On the difference of temperature dependence of metal gate and poly gate SOI MOSFET threshold voltages
Shu-Jen Han, Xinlin Wang, Chang, P., Dechao Guo, Myung-Hee Na, Ken Rim
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
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Conference Proceeding
Novel Critical Path Aware transistor optimization for mobile SoC device-circuit co-design
Mojumder, Niladri N., Song, S. C., Wang, Joseph, Ken Lin, Rim, Ken, Xu, Jeff, Yeap, Geoffrey
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
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Conference Proceeding
A comparative study of fin-last and fin-first SOI FinFETs
Lu, Darsen, Chang, Josephine, Guillorn, Michael A., Chung-Hsun Lin, Johnson, Jeffrey, Oldiges, Philip, Rim, Ken, Khare, Mukesh, Haensch, Wilfried
Published in 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2013)
Published in 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2013)
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Conference Proceeding