by Malobabic, S., Salcedo, J. A., Righter, A. W., Hajjar, J., Liou, J. J.
Published in IEEE electron device letters (01.09.2011)

by Beasley, J S, Righter, A W, Apodaca, C J, Pour-Mozafari, S, Huggett, D
Published in Proceedings - International Test Conference (01.01.1997)

by Yuanzhong Zhou, Righter, A W, Hajjar, J
Published in 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (01.11.2010)

by Hawkins, C.F., Soden, J.M., Righter, A.W., Ferguson, F.J.
Published in Proceedings., International Test Conference (1994)

by Righter, A.W., Hawkins, C.F., Soden, J.M., Maxwell, P.
Published in Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) (1998)

by Righter, A.W.
Published in Proceedings of 1995 IEEE International Test Conference (ITC) (1995)