Sensitivity of CMOS based imagers and scaling perspectives
Lule, T., Benthien, S., Keller, H., Mutze, F., Rieve, P., Seibel, K., Sommer, M., Bohm, M.
Published in IEEE transactions on electron devices (01.11.2000)
Published in IEEE transactions on electron devices (01.11.2000)
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Journal Article
a-Si:H color imagers and colorimetry
Rieve, P, Sommer, M, Wagner, M, Seibel, K, Böhm, M
Published in Journal of non-crystalline solids (01.05.2000)
Published in Journal of non-crystalline solids (01.05.2000)
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Journal Article
Bias sensitive a-Si(C): H multispectral detectors
Zhu, Q., Coors, S., Schneider, B., Rieve, P., Bohm, M.
Published in IEEE transactions on electron devices (01.07.1998)
Published in IEEE transactions on electron devices (01.07.1998)
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Journal Article
TFA image sensors: from the one transistor cell to a locally adaptive high dynamic range sensor
Schneider, B., Fischer, H., Benthien, S., Keller, H., Lule, T., Rieve, P., Sommer, M., Schulte, J., Bohm, M.
Published in International Electron Devices Meeting. IEDM Technical Digest (1997)
Published in International Electron Devices Meeting. IEDM Technical Digest (1997)
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Conference Proceeding
Image Sensors in TFA Technology and their Applications for Image Pre-Processing
Eckhardt, A., Schneider, B., Blecher, F., Sterzel, J., Seibel, K., Bohm, M., Benthien, S., Keller, H., Lule, T., Rieve, P., Sommer, M.
Published in 28th European Solid-State Device Research Conference (1998)
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Published in 28th European Solid-State Device Research Conference (1998)
Conference Proceeding
Design and fabrication of a high dynamic range image sensor in TFA technology
Bohm, M., Lule, T., Fischer, H., Schulte, J., Schneider, B., Benthien, S., Blecher, F., Coors, S., Eckhardt, A., Keller, H., Rieve, P., Seibel, K., Sommer, M., Sterzel, J.
Published in 1998 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.98CH36215) (1998)
Published in 1998 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.98CH36215) (1998)
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Conference Proceeding