A study on failure prediction in a plasma reactor
Rietman, E.A., Beachy, M.
Published in IEEE transactions on semiconductor manufacturing (01.11.1998)
Published in IEEE transactions on semiconductor manufacturing (01.11.1998)
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Journal Article
Conference Proceeding
A system model for feedback control and analysis of yield: A multistep process model of effective gate length, poly line width, and IV parameters
Rietman, E.A., Whitlock, S.A., Beachy, M., Roy, A., Willingham, T.L.
Published in IEEE transactions on semiconductor manufacturing (01.02.2001)
Published in IEEE transactions on semiconductor manufacturing (01.02.2001)
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Journal Article
Pre-production results demonstrating multiple-system models for yield analysis
Rietman, E.A., Friedman, D.J., Lory, E.R.
Published in IEEE transactions on semiconductor manufacturing (01.11.1997)
Published in IEEE transactions on semiconductor manufacturing (01.11.1997)
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Journal Article
Adaptive control in nonlinear dynamic systems with inherent delays
Rietman, E.A., Frye, R.C.
Published in IJCNN-91-Seattle International Joint Conference on Neural Networks (1991)
Published in IJCNN-91-Seattle International Joint Conference on Neural Networks (1991)
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Conference Proceeding
Crown ether enhancement of ionic conductivity in a polymer-salt system
Kaplan, M.L., Rietman, E.A., Cava, R.J., Holt, L.K., Chandross, E.A.
Published in Solid state ionics (01.10.1987)
Published in Solid state ionics (01.10.1987)
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Journal Article
Multi-step process yield control with large system models
Rietman, E.A.
Published in Proceedings of the 1997 American Control Conference (Cat. No.97CH36041) (1997)
Published in Proceedings of the 1997 American Control Conference (Cat. No.97CH36041) (1997)
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Conference Proceeding
Lithium insertion, electrical conductivity, and chemical substitution in various crystallographic shear structures
Cava, R.J., Murphy, D.W., Rietman, E.A., Zahurak, S.M., Barz, H.
Published in Solid state ionics (01.01.1983)
Published in Solid state ionics (01.01.1983)
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Journal Article