Wafer curvature analysis in 3C-SiC layers grown on (001) and (111) Si substrates
Bosi, Matteo, Attolini, Giovanni, Watts, Bernard E., Rossi, Francesca, Ferrari, Claudio, Riesz, Ferenc, Jiang, Liudi
Published in Journal of crystal growth (01.03.2011)
Published in Journal of crystal growth (01.03.2011)
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Conference Proceeding
Relationship between structural changes, hydrogen content and annealing in stacks of ultrathin Si/Ge amorphous layers
Frigeri, Cesare, Serényi, Miklós, Khánh, Nguyen Quoc, Csik, Attila, Riesz, Ferenc, Erdélyi, Zoltán, Nasi, Lucia, Beke, Dezső László, Boyen, Hans-Gerd
Published in Nanoscale research letters (01.03.2011)
Published in Nanoscale research letters (01.03.2011)
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Makyoh topography for the morphological study of compound semiconductor wafers and structures
Riesz, Ferenc
Published in Materials science & engineering. B, Solid-state materials for advanced technology (22.03.2001)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (22.03.2001)
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Conference Proceeding
Measurement of ion emission from plasmas obtained with a 600 fs KrF laser
Ry, Leszek, Barna, Angela, Calcagno, Lucia, Földes, Istvan B, Parys, Piotr, Riesz, Ferenc, Rosi ski, Marcin, Szatmári, Sándor, Torrisi, Lorenzo
Published in Physica scripta (01.05.2014)
Published in Physica scripta (01.05.2014)
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