Gate-oxide grown on the sidewalls and base of a U-shaped Si trench: effects of the oxide and oxide/Si interface condition on the properties of vertical MOS devices
Suliman, S.A., Awadelkarim, O.O., Ridley, R.S., Dolny, G.M.
Published in Microelectronic engineering (01.04.2004)
Published in Microelectronic engineering (01.04.2004)
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Journal Article
Conference Proceeding
The dependence of UMOSFET characteristics and reliability on geometry and processing
Suliman, S A, Gollagunta, N, Trabzon, L, Hao, J, Ridley, R S, Knoedler, C M, Dolny, G M, Awadelkarim, O O, Fonash, S J
Published in Semiconductor science and technology (01.06.2001)
Published in Semiconductor science and technology (01.06.2001)
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Journal Article
Electron and hole trapping in the bulk and interface with Si of a thermal oxide grown on the sidewalls and base of a U-shaped silicon trench
Suliman, S.A., Awadelkarim, O.O., Fonash, S.J., Ridley, R.S., Dolny, G.M., Hao, J., Knoedler, C.M.
Published in Solid-state electronics (01.06.2002)
Published in Solid-state electronics (01.06.2002)
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Journal Article
Effect of nitridation on the reliability of thick gate oxides
Wu, C.-T., Mieckowski, A., Ridley, R.S., Dolny, G., Grebs, T., Linn, J., Ruzyllo, J.
Published in Microelectronics and reliability (2003)
Published in Microelectronics and reliability (2003)
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Journal Article
Electrical properties of the gate oxide and its interface with Si in U-shaped trench MOS capacitors: The impact of polycrystalline Si doping and oxide composition
Suliman, S.A., Venkataraman, B., Wu, C.-T., Ridley, R.S., Dolny, G.M., Awadelkarim, O.O., Fonash, S.J., Ruzyllo, J.
Published in Solid-state electronics (01.05.2003)
Published in Solid-state electronics (01.05.2003)
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Journal Article
Growth and reliability of thick gate oxide in U-trench for power MOSFETs
Wu, C.-T., Ridley, R.S., Dolny, G., Grebs, T., Knoedler, C., Suliman, S., Venkataraman, B., Awadelkarim, O., Ruzyllo, J.
Published in Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics (2002)
Published in Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics (2002)
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Conference Proceeding
Haematin (haem) polymerization and its inhibition by quinoline antimalarials
R. G. RIDLEY, A. DORN, S. R. VIPPAG, BY
Published in Annals of tropical medicine and parasitology (01.07.1997)
Published in Annals of tropical medicine and parasitology (01.07.1997)
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Journal Article
Superjunction structures for power devices and methods of manufacture
YEDINAK JOSEPH A, SHENOY PRAVEEN MURALEEDHARAN, YILMAZ HAMZA, PAN JAMES, RINEHIMER MARK L, RIDLEY, SR. RODNEY S
Year of Publication 08.07.2014
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Year of Publication 08.07.2014
Patent
Superjunction Structures for Power Devices and Methods of Manufacture
YUN CHONGMAN, YEDINAK JOSEPH A, SHENOY PRAVEEN MURALEEDHARAN, LEE JAEGIL, REXER CHRISTOPHER L, YILMAZ HAMZA, HEIDENREICH HAROLD, PAN JAMES, RINEHIMER MARK L, REICHL DWAYNE S, RIDLEY, SR. RODNEY S
Year of Publication 01.11.2012
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Year of Publication 01.11.2012
Patent
Superjunction Structures for Power Devices and Methods of Manufacture
YUN CHONGMAN, YEDINAK JOSEPH A, SHENOY PRAVEEN MURALEEDHARAN, LEE JAEGIL, REXER CHRISTOPHER L, YILMAZ HAMZA, HEIDENREICH HAROLD, PAN JAMES, RINEHIMER MARK L, REICHL DWAYNE S, RIDLEY, SR. RODNEY S
Year of Publication 01.11.2012
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Year of Publication 01.11.2012
Patent
Buried gate-field termination structure
KRAFT NATHAN LAWRENCE, KOCON CHRISTOPHER B, SKURKEY LOUISE E, DOLNY GARY M, GREBS THOMAS E, RIDLEY, SR. RODNEY S
Year of Publication 16.11.2004
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Year of Publication 16.11.2004
Patent
Backmetal drain terminal with low stress and thermal resistance
CUMBO JOSEPH LEONARD, GREBS THOMAS EUGENE, LAUFFER JEFFREY EDWARD, RIDLEY, SR. RODNEY SYLVESTER, SPINDLER JEFFREY P
Year of Publication 03.04.2001
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Year of Publication 03.04.2001
Patent