by Doyen, C., Ricq, S., Fonteneau, P., Marcelot, O., Magnan, P.
Published in IEEE transactions on electron devices (01.06.2021)

by Roy, Francois, Tournier, A., Wehbe-Alause, H., Blanchet, F., Boulenc, P., Leverd, F., Favennec, L., Perrot, C., Pinzelli, L., Gatefait, M., Cherault, N., Jeanjean, D., Carrere, J. P., Augier, C., Ricq, S., Herault, D., Hulot, S.
Published in Physica status solidi. C (01.01.2014)

by Malinge, P., Lalanne, F., Herault, D., Ferrotti, T., Simony, L., Bigault, S., Favreau, J., Nassiet, T., Sacchettini, Y., Augier, C., Ricq, S., Waltz, P., Brun, F., Roux, N., Glais, A., Roffet, G., Chua, L., Duey, J.R., Tournier, A.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)

by Lopez, D., Leyris, C., Ricq, S., Balestra, F.
Published in 2009 Proceedings of the European Solid State Device Research Conference (01.09.2009)

by Sacchettini, Y., Carrere, J.-P., Doyen, C., Duru, R., Courouble, K., Ricq, S., Goiffon, V., Magnan, P.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)

by Lopez, D., Monsieur, F., Ricq, S., Roux, J.-M., Balestra, F.
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)

by Ricq, Stéphane, Glasser, Francis, Garcin, Michel
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (01.02.2001)

by Ricq, Stéphane, Glasser, Francis, Garcin, Michel
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (11.03.2000)

by Steckel, J. S., Josse, E., Pattantyus-Abraham, A. G., Bidaud, M., Mortini, B., Bilgen, H., Arnaud, O., Allegret-Maret, S., Saguin, F., Mazet, L., Lhostis, S., Berger, T., Haxaire, K., Chapelon, L. L., Parmigiani, L., Gouraud, P., Brihoum, M., Bar, P., Guillermet, M., Favreau, S., Duru, R., Fantuz, J., Ricq, S., Ney, D., Hammad, I., Roy, D., Arnaud, A., Vianne, B., Nayak, G., Virollet, N., Farys, V., Malinge, P., Tournier, A., Lalanne, F., Crocherie, A., Galvier, J., Rabary, S., Noblanc, O., Wehbe-Alause, H., Acharya, S., Singh, A., Meitzner, J., Aher, D., Yang, H., Romero, J., Chen, B., Hsu, C., Cheng, K. C., Chang, Y., Sarmiento, M., Grange, C., Mazaleyrat, E., Rochereau, K.
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)

by Coudrain, P., Batude, P., Gagnard, X., Leyris, C., Ricq, S., Vinet, M., Pouydebasque, A., Moussy, N., Cazaux, Y., Giffard, B., Magnan, P., Ancey, P.
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)