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Two-unit redundant system with random shocks and inspection
Agnihotri, R.K., Singhal, Govind, Khandelwal, S.K.
Published in Microelectronics and reliability (1992)
Published in Microelectronics and reliability (1992)
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Analysis of one-server two-unit parallel system subject to degradation
Gopalan, M.N., Ramesh, T.K., Krishna Kumar, K.V.
Published in Microelectronics and reliability (1986)
Published in Microelectronics and reliability (1986)
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