Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations
MEINHARDT, C, ZIMPECK, A. L, REIS, R. A. L
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Conference Proceeding
Computational Tools To Assist Relay Settings Of Pilot Scheme
Gouveia, F. A. O., Neves, W. L. A., Reis, R. L. A.
Published in 2019 IEEE Canadian Conference of Electrical and Computer Engineering (CCECE) (05.05.2019)
Published in 2019 IEEE Canadian Conference of Electrical and Computer Engineering (CCECE) (05.05.2019)
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Conference Proceeding
Incorrect Operations of Pilot Scheme with Ground Overcurrent Protection
Gouveia, F. A. O., Neves, W. L. A., Reis, R. L. A.
Published in 2019 IEEE Canadian Conference of Electrical and Computer Engineering (CCECE) (05.05.2019)
Published in 2019 IEEE Canadian Conference of Electrical and Computer Engineering (CCECE) (05.05.2019)
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Conference Proceeding
Evaluation of single-ended impedance-based transmission fault location using fixed and variable window phasor estimation approaches
Reis, R.L.A., Lopes, F.V., Leite, E.J.S., Zat, G., Souza, J.V., Scheid, A., Jahn, T.G.
Published in Electric power systems research (01.10.2023)
Published in Electric power systems research (01.10.2023)
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Journal Article
Equivalent grid-following inverter-based generator model for ATP/ATPDraw simulations
Luchini, M.B., Batista, O.E., Lopes, F.V., Reis, R.L.A., Souza, B.A.
Published in Electric power systems research (01.10.2023)
Published in Electric power systems research (01.10.2023)
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Journal Article
Traveling wave-based fault locators: Performance analysis in series-compensated transmission lines
Reis, R.L.A., Lopes, F.V., Ribeiro, E.P., Moraes, C.M., Silva, K.M., Britto, A.M., Agostinho, R.L., Rodrigues, M.A.M.
Published in Electric power systems research (01.10.2023)
Published in Electric power systems research (01.10.2023)
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Journal Article
Impact of PVT variability on 20 nm FinFET standard cells
Zimpeck, A.L., Meinhardt, C., Reis, R.A.L.
Published in Microelectronics and reliability (01.08.2015)
Published in Microelectronics and reliability (01.08.2015)
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Journal Article
Impact of different transistor arrangements on gate variability
Zimpeck, A.L., Meinhardt, C., Artola, L., Hubert, G., Kastensmidt, F.L., Reis, R.A.L.
Published in Microelectronics and reliability (01.09.2018)
Published in Microelectronics and reliability (01.09.2018)
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Journal Article
Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies
Almeida, R.B., Marques, C.M., Butzen, P.F., Silva, F.R.G., Reis, R.A.L., Meinhardt, C.
Published in Microelectronics and reliability (01.09.2018)
Published in Microelectronics and reliability (01.09.2018)
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Journal Article
Circuit design using Schmitt Trigger to reliability improvement
Zimpeck, A.L., Meinhardt, C., Artola, L., Hubert, G., Kastensmidt, F.L., Reis, R.A.L.
Published in Microelectronics and reliability (01.11.2020)
Published in Microelectronics and reliability (01.11.2020)
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Journal Article
Practical assessment of POTT and DCB teleprotection schemes using computer environment
Meira, R.N., de Lima, R.C.D., Nascimento, J.P., Brito, N.S.D., Lopes, F.V., Reis, R.L.A.
Published in Electric power systems research (01.07.2021)
Published in Electric power systems research (01.07.2021)
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Journal Article
Effects of CCVT stray capacitances on traveling wave-based applications
Reis, R.L.A., Lopes, F.V., Neves, W.L.A., Fernandes Jr, D., Almeida Neto, F.G.
Published in Electric power systems research (01.06.2021)
Published in Electric power systems research (01.06.2021)
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Journal Article
Gate mapping impact on variability robustness in FinFET technology
Brendler, L.H., Zimpeck, A.L., Meinhardt, C., Reis, R.A.L.
Published in Microelectronics and reliability (01.09.2019)
Published in Microelectronics and reliability (01.09.2019)
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Journal Article
Mitigation of process variability effects using decoupling cells
Zimpeck, A.L., Meinhardt, C., Artola, L., Hubert, G., Kastensmidt, F.L., Reis, R.A.L.
Published in Microelectronics and reliability (01.09.2019)
Published in Microelectronics and reliability (01.09.2019)
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Journal Article
Impact of PVT variability on 20nm FinFET standard cells
Zimpeck, A.L., Meinhardt, C., Reis, R.A.L.
Published in Microelectronics and reliability (01.08.2015)
Published in Microelectronics and reliability (01.08.2015)
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Journal Article
Gluon saturation and leading particle spectra in pp collisions
Durães, F. O., Gonçalves, V. P., Navarra, F. S., Reis, A. L. V. R. dos, Wilk, G.
Published in Brazilian journal of physics (01.03.2007)
Published in Brazilian journal of physics (01.03.2007)
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Journal Article
Comparação Entre Técnicas de Estimação Fasorial de Janelas Fixa e Variável Sob o Desempenho de Métodos de Localização de Faltas [Not available in English]
Mateus, V. S., Barros, V. E., Reis, R. L. A., Almeida Neto, F. G.
Published in 2021 14th IEEE International Conference on Industry Applications (INDUSCON) (15.08.2021)
Published in 2021 14th IEEE International Conference on Industry Applications (INDUSCON) (15.08.2021)
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Conference Proceeding