High-Spatial-Resolution Low-Energy Electron Beam X-Ray Microanalysis
Barkshire, Ian, Karduck, Peter, Rehbach, Werner P., Richter, Silvia
Published in Mikrochimica acta (1966) (01.01.2000)
Published in Mikrochimica acta (1966) (01.01.2000)
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Journal Article
The improved optoelectronic characterization in annealed Al/AZO layer after sputtering
Wen-Kuan Lin, Yi-Chuan Wang, Wei-Che Huang, Ze-Syue Wu, Ci-Sheng Cai, Yen-Sheng Lin, Rehbach, Werner P.
Published in 2013 International Symposium on Next-Generation Electronics (01.02.2013)
Published in 2013 International Symposium on Next-Generation Electronics (01.02.2013)
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Conference Proceeding