Security EDA Extension through P1687.1 and 1687 Callbacks
Portolan, Michele, Reynaud, Vincent, Maistri, Paolo, Leveugle, Regis, Di Natale, Giorgio
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
Get full text
Conference Proceeding
A New Critical Variable Analysis in Processor-Based Systems
Bergaoui, Salma, Vanhauwaert, Pierre, Leveugle, Regis
Published in IEEE transactions on nuclear science (01.08.2010)
Published in IEEE transactions on nuclear science (01.08.2010)
Get full text
Journal Article
Secured Bus as a Countermeasure against Covert Channels: NEORV32 Case Study
Leveugle, Regis, Hocquette, Nathan, Labarre, Charles, Plumaugat, Romain, Tcharoukian, Loic, Martinoli, Valentin, Teglia, Yannick
Published in 2024 IEEE 25th Latin American Test Symposium (LATS) (09.04.2024)
Published in 2024 IEEE 25th Latin American Test Symposium (LATS) (09.04.2024)
Get full text
Conference Proceeding
CCALK: (When) CVA6 Cache Associativity Leaks the Key
Martinoli, Valentin, Tourneur, Elouan, Teglia, Yannick, Leveugle, Régis
Published in Journal of low power electronics and applications (01.03.2023)
Published in Journal of low power electronics and applications (01.03.2023)
Get full text
Journal Article
Dynamic Authentication-Based Secure Access to Test Infrastructure
Portolan, Michele, Reynaud, Vincent, Maistri, Paolo, Leveugle, Regis
Published in 2020 IEEE European Test Symposium (ETS) (01.05.2020)
Published in 2020 IEEE European Test Symposium (ETS) (01.05.2020)
Get full text
Conference Proceeding
High-level fault injection to assess FMEA on critical systems
Roux, Julie, Beroulle, Vincent, Morin-Allory, Katell, Leveugle, Régis, Bossuet, Lilian, Cézilly, Frédéric, Berthoz, Frédéric, Genévrier, Gilles, Cerisier, François
Published in Microelectronics and reliability (01.07.2021)
Published in Microelectronics and reliability (01.07.2021)
Get full text
Journal Article
Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model
Dutertre, Jean-Max, Beroulle, Vincent, Candelier, Philippe, De Castro, Stephan, Faber, Louis-Barthelemy, Flottes, Marie-Lise, Gendrier, Philippe, Hely, David, Leveugle, Regis, Maistri, Paolo, Di Natale, Giorgio, Papadimitriou, Athanasios, Rouzeyre, Bruno
Published in 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) (01.09.2018)
Published in 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) (01.09.2018)
Get full text
Conference Proceeding
Cross-layer Approach to Assess FMEA on Critical Systems and Evaluate High-Level Model Realism
Roux, Julie, Morin-Allory, Katell, Beroulle, Vincent, Leveugle, Regis, Bossuet, Lilian, Cezilly, Frederic, Berthoz, Frederic, Genevrier, Gilles, Cerisier, Francois
Published in 2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC) (04.10.2021)
Published in 2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC) (04.10.2021)
Get full text
Conference Proceeding
High Level Fault Injection Method for Evaluating Critical System Parameter Ranges
Roux, Julie, Beroulle, Vincent, Morin-Allory, Katell, Leveugle, Regis, Bossuet, Lilian, Cezilly, Frederic, Berthoz, Frederic, Genevrier, Gilles, Cerisier, Francois
Published in 2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (23.11.2020)
Published in 2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (23.11.2020)
Get full text
Conference Proceeding
Cross Layer Fault Simulations for Analyzing the Robustness of RTL Designs in Airborne Systems
Roux, Julie, Beroulle, Vincent, Morin-Allory, Katell, Leveugle, Regis, Bossuet, Lilian, Cezilly, Frederic, Berthoz, Frederic, Genevrier, Gilles, Cerisier, Francois
Published in 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) (01.04.2020)
Published in 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) (01.04.2020)
Get full text
Conference Proceeding
Alternatives to Fault Injections for Early Safety/Security Evaluations
Portolan, Michele, Savino, Alessandro, Leveugle, Regis, Di Carlo, Stefano, Bosio, Alberto, Di Natale, Giorgio
Published in 2019 IEEE European Test Symposium (ETS) (01.05.2019)
Published in 2019 IEEE European Test Symposium (ETS) (01.05.2019)
Get full text
Conference Proceeding