by Sweeney, Daniel C., Kyle Reed, F., Goetz, K. C., Buchalter, Adam P., Dianne Bull Ezell, N.
Published in IEEE transactions on nuclear science (01.06.2024)

by Sun, Kan, Wu, Yongjia, Qian, Feng, Jung, Hyunjun, Kaluvan, Suresh, Huijin, He, Zhang, Cheng, Reed, F. Kyle, Nance Ericson, M., Zhang, Haifeng, Zuo, Lei
Published in Annals of nuclear energy (01.11.2022)

by Reed, F. Kyle, Ericson, M. Nance, Ezell, N. Dianne Bull, Kisner, Roger A., Zuo, Lei, Zhang, Haifeng, Flammang, Robert
Published in Nuclear technology (03.10.2022)

by Reed, F. Kyle, Ericson, M. Nance, Ezell, N. Bull, Kisner, Roger A., Zuo, Lei, Zhang, Haifeng, Flammang, Robert
Published in Nuclear technology (28.06.2022)

by Reed, F Kyle
Year of Publication 01.01.2022

by Sun, Kan, Wu, Yongjia, Qian, Feng, Jung, Hyunjun, Kaluvan, Suresh, Huijin, He, Zhang, Cheng, Reed, F. Kyle, Ericson, M. Nance, Zhang, Haifeng, Zuo, Lei
Published in Annals of nuclear energy (09.07.2022)

by Anderson, Adam, Young, Steven R, Reed, F. Kyle, Vann, Jason M
Year of Publication 29.08.2019

by Anderson, Adam, Young, Steven R, Reed, F Kyle, Vann, Jason M
Published in arXiv.org (29.08.2019)

by LaRiviere, B., Ramuhalli, P., Reed, F. K., Joshi, P. C., Ericson, M. N., Aytug, T., Crespillo, M. L., Zinkle, S. J., Weber, W. J., Zarkadoula, E.
Published in IEEE transactions on device and materials reliability (01.12.2022)