Switched Bias Differential MOSFET Dosimeter
Garcia-Inza, M., Carbonetto, S., Lipovetzky, J., Carra, M. J., Sambuco Salomone, L., Redin, E. G., Faigon, A.
Published in IEEE transactions on nuclear science (01.06.2014)
Published in IEEE transactions on nuclear science (01.06.2014)
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Journal Article
Deep electron traps in HfO2-based metal-oxide-semiconductor capacitors
Salomone, L. Sambuco, Lipovetzky, J., Carbonetto, S.H., García Inza, M.A., Redin, E.G., Campabadal, F., Faigón, A.
Published in Thin solid films (01.02.2016)
Published in Thin solid films (01.02.2016)
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Journal Article
Numerical Modeling of MOS Dosimeters Under Switched Bias Irradiations
Sambuco Salomone, L., Faigon, A., Redin, E. G.
Published in IEEE transactions on nuclear science (01.08.2015)
Published in IEEE transactions on nuclear science (01.08.2015)
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Journal Article
Zero Temperature Coefficient Bias in MOS Devices. Dependence on Interface Traps Density, Application to MOS Dosimetry
Carbonetto, S. H., Garcia Inza, Mariano A., Lipovetzky, J., Redin, E. G., Salomone, L. S., Faigon, A.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Floating Gate PMOS Dosimeters Under Bias Controlled Cycled Measurement
Inza, M G, Lipovetzky, J, Redin, E G, Carbonetto, S, Faigon, A
Published in IEEE transactions on nuclear science (01.06.2011)
Published in IEEE transactions on nuclear science (01.06.2011)
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Journal Article
Electrically Erasable Metal-Oxide-Semiconductor Dosimeters
Lipovetzky, J., Redin, E.G., Faigon, A.
Published in IEEE transactions on nuclear science (01.08.2007)
Published in IEEE transactions on nuclear science (01.08.2007)
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Journal Article
Pulsed capacitance-voltage measurements on Al2O3-based MOS capacitors
Sambuco Salomone, L., Lipovetzky, J., Carbonetto, S. H., Garcia-Inza, M. A., Redin, E. G., Campabadal, F., Faigon, A.
Published in 2014 Argentine Conference on Micro-Nanoelectronics, Technology and Applications (EAMTA) (01.07.2014)
Published in 2014 Argentine Conference on Micro-Nanoelectronics, Technology and Applications (EAMTA) (01.07.2014)
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Conference Proceeding
Radiation response of Al2O3-based MOS capacitors under different bias conditions
Sambuco Salomone, L., Kasulin, A., Lipovetzky, J., Carbonetto, S. H., Inza, M. A. Garcia, Redin, E. G., Berbeglia, F., Campabadal, F., Faigon, A.
Published in 2013 7th Argentine School of Micro-Nanoelectronics, Technology and Applications (01.08.2013)
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Published in 2013 7th Argentine School of Micro-Nanoelectronics, Technology and Applications (01.08.2013)
Conference Proceeding
Charge trapping/detrapping in HfO2-based MOS devices
Salomone, L. S., Carbonetto, S. H., Garcia Inza, M. A., Lipovetzky, J., Redin, E. G., Campabadal, F., Faigon, A.
Published in 2011 Argentine School of Micro-Nanoelectronics, Technology and Applications (01.08.2011)
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Published in 2011 Argentine School of Micro-Nanoelectronics, Technology and Applications (01.08.2011)
Conference Proceeding
Electron trapping in Al2O3/HfO2 nanolaminate-based MOS capacitors
Salomone, L. S., Campabadal, F., Fernandez, M. I., Lipovetzky, J., Carbonetto, S. H., Inza, M. A. G., Redin, E. G., Faigon, A.
Published in 2012 Argentine School of Micro-Nanoelectronics, Technology and Applications (EAMTA) (01.08.2012)
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Published in 2012 Argentine School of Micro-Nanoelectronics, Technology and Applications (EAMTA) (01.08.2012)
Conference Proceeding
Radiation effects in Al2O3-based MOS capacitors
Salomone, L. S., Campabadal, F., Fernandez, M. I., Lipovetzky, J., Carbonetto, S. H., Inza, M. A. G., Redin, E. G., Faigon, A.
Published in 2012 Argentine School of Micro-Nanoelectronics, Technology and Applications (EAMTA) (01.08.2012)
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Published in 2012 Argentine School of Micro-Nanoelectronics, Technology and Applications (EAMTA) (01.08.2012)
Conference Proceeding
Temperature error minimization in low dose radiation measurements with 140 nm MOS dosimeters
Carbonetto, S H, Inza, M A García, Lipovetzky, J, Redin, E G, Salomone, L Sambuco, Kasulin, A, Faigón, A
Published in 2010 Argentine School of Micro-Nanoelectronics, Technology and Applications (EAMTA) (01.10.2010)
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Published in 2010 Argentine School of Micro-Nanoelectronics, Technology and Applications (EAMTA) (01.10.2010)
Conference Proceeding