DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies
Howell, W., Hapke, F., Brazil, E., Venkataraman, S., Datta, R., Glowatz, A., Redemund, W., Schmerberg, J., Fast, A., Rajski, J.
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
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Conference Proceeding
Defect-oriented cell-internal testing
Hapke, F, Redemund, W, Schloeffel, J, Krenz-Baath, R, Glowatz, A, Wittke, M, Hashempour, H, Eichenberger, S
Published in 2010 IEEE International Test Conference (01.11.2010)
Published in 2010 IEEE International Test Conference (01.11.2010)
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Conference Proceeding
Cell-aware analysis for small-delay effects and production test results from different fault models
Hapke, F., Schloeffel, J., Redemund, W., Glowatz, A., Rajski, J., Reese, M., Rearick, J., Rivers, J.
Published in 2011 IEEE International Test Conference (01.09.2011)
Published in 2011 IEEE International Test Conference (01.09.2011)
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Conference Proceeding
Cell-aware Production test results from a 32-nm notebook processor
Hapke, F., Reese, M., Rivers, J., Over, A., Ravikumar, V., Redemund, W., Glowatz, A., Schloeffel, J., Rajski, J.
Published in 2012 IEEE International Test Conference (01.11.2012)
Published in 2012 IEEE International Test Conference (01.11.2012)
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Conference Proceeding
Cell-aware experiences in a high-quality automotive test suite
Hapke, F., Arnold, R., Beck, M., Baby, M., Straehle, S., Goncalves, J. F., Panait, A., Behr, R., Maugard, G., Prashanthi, A., Schloeffel, J., Redemund, W., Glowatz, A., Fast, A., Rajski, J.
Published in 2014 19th IEEE European Test Symposium (ETS) (01.05.2014)
Published in 2014 19th IEEE European Test Symposium (ETS) (01.05.2014)
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Conference Proceeding