The development of a MEMS six-port reflectometer calibration standard
Reck, T.J., Weikle, R.M., Barker, N.S.
Published in 2009 IEEE MTT-S International Microwave Symposium Digest (01.06.2009)
Published in 2009 IEEE MTT-S International Microwave Symposium Digest (01.06.2009)
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