Silicon Σ13(501) grain boundary interface structure determined by bicrystal Bragg rod X-ray scattering
Howes, P.B., Rhead, S., Roy, M., Nicklin, C.L., Rawle, J.L., Norris, C.A.
Published in Acta materialia (01.09.2013)
Published in Acta materialia (01.09.2013)
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Journal Article
A grazing incidence small angle X-ray scattering study of the effect of growth interrupt on the structure of InAs quantum dots
Howes, P.B., Rawle, J.L., Everard, M.J., Baker, S.H., Henini, M., Patane, A., Pulizzi, F.
Published in 2003 Third IEEE Conference on Nanotechnology, 2003. IEEE-NANO 2003 (2003)
Published in 2003 Third IEEE Conference on Nanotechnology, 2003. IEEE-NANO 2003 (2003)
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Conference Proceeding