Optical characterization of patterned thin films
Rosu, D., Petrik, P., Rattmann, G., Schellenberger, M., Beck, U., Hertwig, A.
Published in Thin solid films (28.11.2014)
Published in Thin solid films (28.11.2014)
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Journal Article
Conference Proceeding
Trench gate integration into planar technology for reduced on-resistance in LDMOS devices
Erlbacher, T, Rattmann, G, Bauer, A J, Frey, L
Published in 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2010)
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Published in 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2010)
Conference Proceeding