Method and structure for determining thermal cycle reliability
Filippi Ronald G, McGahay Vincent J, McLaughlin Paul S, Murray Conal E, Wang Ping-Chuan, Gill Jason P, Rathore Hazara S, Shaw Thomas M
Year of Publication 13.09.2016
Get full text
Year of Publication 13.09.2016
Patent
METHOD AND STRUCTURE FOR DETERMINING THERMAL CYCLE RELIABILITY
FILIPPI RONALD G, MURRAY CONAL E, MCLAUGHLIN PAUL S, MCGAHAY VINCENT J, RATHORE HAZARA S, SHAW THOMAS M, WANG PINGUAN, GILL JASON P
Year of Publication 17.09.2015
Get full text
Year of Publication 17.09.2015
Patent
Method for prediction of premature dielectric breakdown in a semiconductor
COWLEY ANDREW P, MCLAUGHLIN PAUL S, EDWARDS ROBERT D, RATHORE HAZARA S, BARILE CONRAD A, CLEVENGER LAWRENCE A, CHANDA KAUSHIK, YANG CHIHAO
Year of Publication 08.11.2011
Get full text
Year of Publication 08.11.2011
Patent
Dual damascene multi-level metallization
SULLIVAN TIMOTHY D, AGARWALA BIRENDRA N, WACHNIK RICHARD A, RATHORE HAZARA S, CORREALE, JR. ANTHONY, COKER ERIC M
Year of Publication 30.12.2008
Get full text
Year of Publication 30.12.2008
Patent
Dual damascene multi-level metallization
Agarwala, Birendra N, Coker, Eric M, Correale, Jr, Anthony, Rathore, Hazara S, Sullivan, Timothy D, Wachnik, Richard A
Year of Publication 30.12.2008
Get full text
Year of Publication 30.12.2008
Patent