Correction to "New double-byte error-correcting codes for memory systems"
Gui-Liang Feng, Xin-Wen Wu, Rao, T.R.N.
Published in IEEE transactions on information theory (01.09.1999)
Published in IEEE transactions on information theory (01.09.1999)
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Journal Article
Correction to "Berger Check Prediction for Array Multipliers and Array Dividers"
Jien-Chung Lo, Thanawastien, S., Rao, T.R.N.
Published in IEEE transactions on computers (01.03.1996)
Published in IEEE transactions on computers (01.03.1996)
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Journal Article
Pseudorandom bit generators in stream-cipher cryptography
Zeng, K., Yang, C.-H., Wei, D.-Y., Rao, T.R.N.
Published in Computer (Long Beach, Calif.) (01.02.1991)
Published in Computer (Long Beach, Calif.) (01.02.1991)
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Journal Article
New double-byte error-correcting codes for memory systems
Gui-Liang Feng, Xinwen Wu, Rao, T.R.N.
Published in IEEE transactions on information theory (01.05.1998)
Published in IEEE transactions on information theory (01.05.1998)
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Journal Article
Simplified understanding and efficient decoding of a class of algebraic-geometric codes
Gui-Liang Feng, Wei, V.K., Rao, T.R.N., Tzeng, K.K.
Published in IEEE transactions on information theory (01.07.1994)
Published in IEEE transactions on information theory (01.07.1994)
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Journal Article
Generalized Bezout's theorem and its applications in coding theory
Gui-Liang Feng, Rao, T.R.N., Berg, G.A., Zhunmei Zhu
Published in IEEE transactions on information theory (01.11.1997)
Published in IEEE transactions on information theory (01.11.1997)
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Journal Article
An apparatus for pseudo-deterministic testing
Mukund, S.K., McCluskey, E.J., Rao, T.R.N.
Published in Proceedings 13th IEEE VLSI Test Symposium (1995)
Published in Proceedings 13th IEEE VLSI Test Symposium (1995)
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Conference Proceeding
Constructions of the SbEC-DbED and DbEC codes, and their applications
Feng, G.L., Sihai Xiao, Xiaofa Shi, Rao, T.R.N.
Published in Proceedings of International Workshop on Defect and Fault Tolerance in VLSI (1995)
Published in Proceedings of International Workshop on Defect and Fault Tolerance in VLSI (1995)
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Conference Proceeding